Capabilities of an Argon Fluoride 193 nm excimer laser for laser ablation inductively coupled plasma mass spectometry microanalysis of geological materials

Journal of Analytical Atomic Spectrometry

Volumn 12, Issue 9, 1997, Pages 939-944

  Günther, Detlef ^a   Frischknecht, Rolf ^a   Heinrich, Christoph A ^a   Kahlert, Hans J ^b  

^a ETH ZURICH   (Switzerland)

^b MicroLas Lasersystem GmbH   (Germany)

Author keywords

Excimer laser; Geological material; Inductively coupled plasma mass spectrometry; Laser ablation

Indexed keywords

LASER ABLATION; MASS SPECTROMETRY; MICROANALYSIS; PLASMA APPLICATIONS; TRACE ANALYSIS; TRACE ELEMENTS;

GEOLOGICAL MATERIALS; INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY;

EXCIMER LASERS;

EID: 0031233821     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/A701423F     Document Type: Article

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