-
2
-
-
0038605746
-
Quantification in trace and ultratrace analyses using glow discharge techniques: Round robin test on pure copper materials
-
Kazik, M. and Venzago, C. and Dorka, R. (2003) Quantification in trace and ultratrace analyses using glow discharge techniques: Round robin test on pure copper materials J. Anal. At. Spectrom., 18, pp. 603-611.
-
(2003)
J. Anal. At. Spectrom.
, vol.18
, pp. 603-611
-
-
Kazik, M.1
Venzago, C.2
Dorka, R.3
-
4
-
-
0034493198
-
Monitoring of depth distribution of trace elements by GDMS
-
Aldave de las Heras, L. and Actis-Dato, E. and Betti, M. and Toscano, E. and Tocci, U. and Fuoco, R. and Giannarelli, S. (2000) Monitoring of depth distribution of trace elements by GDMS Microchem. J., 67, pp. 333-336.
-
(2000)
Microchem. J.
, vol.67
, pp. 333-336
-
-
Aldave de las Heras, L.1
Actis-Dato, E.2
Betti, M.3
Toscano, E.4
Tocci, U.5
Fuoco, R.6
Giannarelli, S.7
-
5
-
-
0031238105
-
Temporal considerations with a microsecond pulsed glow discharge
-
Harrison, W. and Hang, W. and Yan, X. and Ingeneri, K. and Schilling, C. (1997) Temporal considerations with a microsecond pulsed glow discharge J. Anal. At. Spectrom., 12, pp. 891-896.
-
(1997)
J. Anal. At. Spectrom.
, vol.12
, pp. 891-896
-
-
Harrison, W.1
Hang, W.2
Yan, X.3
Ingeneri, K.4
Schilling, C.5
-
6
-
-
0034740355
-
A simple glow discharge ion source for direct solid analysis by on-axis time-of-flight mass spectrometry
-
Pisonero, J. and Costa, J. and Pereiro, R. and Bordel, N. and Sanz-Mandel, A. (2001) A simple glow discharge ion source for direct solid analysis by on-axis time-of-flight mass spectrometry J. Anal. At. Spectrom., 16, pp. 1253-1258.
-
(2001)
J. Anal. At. Spectrom.
, vol.16
, pp. 1253-1258
-
-
Pisonero, J.1
Costa, J.2
Pereiro, R.3
Bordel, N.4
Sanz-Mandel, A.5
-
7
-
-
33646073624
-
Glow-discharge: Glow discharge optical spectroscopy for the analysis of thin films
-
Greene, J. and Whelan, J. (1976) Glow-discharge: Glow discharge optical spectroscopy for the analysis of thin films J. Appl. Phys., 47(11), pp. 6022.
-
(1976)
J. Appl. Phys.
, vol.47
, Issue.11
, pp. 6022
-
-
Greene, J.1
Whelan, J.2
-
9
-
-
0032265854
-
Physical and chemical analytical instruments for failure analyses in Gbit devices
-
Mitsui, Y. and Yano, F. and Nakamura, Y. and Kimoto, K. and Hasegawa, T. and Kimura, S. and Asayama, K. (1998) Physical and chemical analytical instruments for failure analyses in Gbit devices Ext. Abstr. IEDM, pp. 329-332.
-
(1998)
Ext. Abstr. IEDM
, pp. 329-332
-
-
Mitsui, Y.1
Yano, F.2
Nakamura, Y.3
Kimoto, K.4
Hasegawa, T.5
Kimura, S.6
Asayama, K.7
-
10
-
-
46549102420
-
A Contribution to the solution of the problem of quantification in surface-analysis work using glow-discharge-atomic-emission spectroscopy
-
Bengtson, A. (1985) A Contribution to the solution of the problem of quantification in surface-analysis work using glow-discharge-atomic-emission spectroscopy Spectrochim. Acta B, 40.
-
(1985)
Spectrochim. Acta B
, pp. 40
-
-
Bengtson, A.1
-
11
-
-
0343294490
-
Glow discharge optical emission spectroscopy
-
Payling, R. (1998) Glow discharge optical emission spectroscopy Spectroscopy, 13, pp. 13.
-
(1998)
Spectroscopy
, vol.13
, pp. 13
-
-
Payling, R.1
-
12
-
-
0035128091
-
Improved quantitative analysis of hard coatings by radio frequency glow discharge optical emission spectrometry (rf-GD-OES)
-
Payling, R. and Aeberhard, M. and Delfosse, D. (2001) Improved quantitative analysis of hard coatings by radio frequency glow discharge optical emission spectrometry (rf-GD-OES) J. Anal. At. Spectrom., 16, pp. 50.
-
(2001)
J. Anal. At. Spectrom.
, vol.16
, pp. 50
-
-
Payling, R.1
Aeberhard, M.2
Delfosse, D.3
-
15
-
-
2442482411
-
Radio-frequency glow discharge spectrometry: A critical review
-
Winchester, M. and Payling, R. (2004) Radio-frequency glow discharge spectrometry: A critical review Spectrochim. Acta. B, 59, pp. 607-666.
-
(2004)
Spectrochim. Acta. B
, vol.59
, pp. 607-666
-
-
Winchester, M.1
Payling, R.2
-
16
-
-
0041966191
-
Present possibilities of thin-layer analysis by GDOES
-
Hoffmann, V. and Dorka, R. and Wilken, L. and Horoaba, V.-D. and Wetzig, K. (2003) Present possibilities of thin-layer analysis by GDOES Surf. Interface Anal., 25, pp. 575-582.
-
(2003)
Surf. Interface Anal.
, vol.25
, pp. 575-582
-
-
Hoffmann, V.1
Dorka, R.2
Wilken, L.3
Horoaba, V.-D.4
Wetzig, K.5
-
17
-
-
0004296135
-
-
Chichester: John Wiley
-
Payling, R. and Chapon, P. and Shimizu, K. and Passetemps, R. and Jardin, A. and Bourgeois, Y. and Crener, K. and Aeberhard, M. and Michler, J.(2003) Glow Discharge Plasma Analytical Spectroscopy. Chichester: John Wiley.
-
(2003)
Glow Discharge Plasma Analytical Spectroscopy
-
-
Payling, R.1
Chapon, P.2
Shimizu, K.3
Passetemps, R.4
Jardin, A.5
Bourgeois, Y.6
Crener, K.7
Aeberhard, M.8
Michler, J.9
-
18
-
-
0033877579
-
Behavior of the sputtered copper atoms, ions and excited species in a radio-frequency and direct current glow discharge
-
Bogaerts, A. and Gijbels, R. (2000) Behavior of the sputtered copper atoms, ions and excited species in a radio-frequency and direct current glow discharge Spectrchimica Acta B, 55, pp. 279-297.
-
(2000)
Spectrchimica Acta B
, vol.55
, pp. 279-297
-
-
Bogaerts, A.1
Gijbels, R.2
-
19
-
-
1542680532
-
Sputter depth profile analysis of interfaces
-
Hofmann, S. (1998) Sputter depth profile analysis of interfaces Prep. Prog. Phys., 61, pp. 827-888.
-
(1998)
Prep. Prog. Phys.
, vol.61
, pp. 827-888
-
-
Hofmann, S.1
-
20
-
-
2442598810
-
-
RSC. Royal Society of Chemistry Cambridge. chapters 6 and 11. Analytical Spectroscopy Monographs. Analytical Spectroscopy Monographs
-
Nelis, T. and Payling, R.(2004) RSC. In A Guidebook to Glow Discharge Optical Emission Spectroscopy.. Royal Society of Chemistry Cambridge. chapters 6 and 11. Analytical Spectroscopy Monographs. Analytical Spectroscopy Monographs
-
(2004)
A Guidebook to Glow Discharge Optical Emission Spectroscopy
-
-
Nelis, T.1
Payling, R.2
-
22
-
-
2442458421
-
Engineer's thesis: Étude de faisabilité de pulsation de décharges luminescentes radiofréquences en analyse spectrochimique
-
Conservatoire National Des Arts et Metiers. In Paris
-
Vegiotti, J.(1997) Engineer's thesis: Étude de faisabilité de pulsation de décharges luminescentes radiofréquences en analyse spectrochimique. Conservatoire National Des Arts et Metiers. In (pp. 45). Paris
-
(1997)
, pp. 45
-
-
Vegiotti, J.1
-
23
-
-
0032166405
-
Modeling of argon direct current glow discharges and comparison with experiment: How good is the agreement?
-
Bogaerts, A. and Gijbels, R. (1998) Modeling of argon direct current glow discharges and comparison with experiment: How good is the agreement? J Anal. At. Spectrom., 13, pp. 945-953.
-
(1998)
J Anal. At. Spectrom.
, vol.13
, pp. 945-953
-
-
Bogaerts, A.1
Gijbels, R.2
-
24
-
-
0035898781
-
Depth profiling of electrically non conductive layered samples by rf-GDOES and HFM plasma SNMS
-
Hodoroaba, V. and Unger, W. and Jenett, H. and Hoffmann, V. and Hagenhoff, B. and Kayer, S. and Wetzig, K. (2001) Depth profiling of electrically non conductive layered samples by rf-GDOES and HFM plasma SNMS Appl. Surface Sci., 179, pp. 20-37.
-
(2001)
Appl. Surface Sci.
, vol.179
, pp. 20-37
-
-
Hodoroaba, V.1
Unger, W.2
Jenett, H.3
Hoffmann, V.4
Hagenhoff, B.5
Kayer, S.6
Wetzig, K.7
-
26
-
-
0002672975
-
Quantitative analysis of silicon- and aluminium-oxynitride films with EPMA, SIMS, hf-SNMS, hf-GDOES and F-IR Fres
-
Deer, S. (1999) Quantitative analysis of silicon- and aluminium-oxynitride films with EPMA, SIMS, hf-SNMS, hf-GDOES and F-IR Fres. J. Anal. Chem, 365, pp. 85-95.
-
(1999)
J. Anal. Chem
, vol.365
, pp. 85-95
-
-
Deer, S.1
-
27
-
-
0041438463
-
Radio frequency GDOES: A powerful technique for depth profiling analysis of thin films
-
Shimizu, K. and Habazaki, H. and Skeldon, P. and Thompon, G. (2003) Radio frequency GDOES: A powerful technique for depth profiling analysis of thin films Surf. Interface Anal., 35, pp. 564-574.
-
(2003)
Surf. Interface Anal.
, vol.35
, pp. 564-574
-
-
Shimizu, K.1
Habazaki, H.2
Skeldon, P.3
Thompon, G.4
-
28
-
-
0344133774
-
Quantitative depth profiling of thin layers
-
Wetzig, K. and Baunack, S. and Hoffmann, V. and Oswald, S. (1997) Quantitative depth profiling of thin layers Fres J. Anal. Chem., 358, pp. 25-31.
-
(1997)
Fres J. Anal. Chem.
, vol.358
, pp. 25-31
-
-
Wetzig, K.1
Baunack, S.2
Hoffmann, V.3
Oswald, S.4
-
29
-
-
1842588293
-
Depth-resolved analysis of Ni-P plated aluminium hard disks by radio frequency glow discharge optical emission spectroscopy (rf-GD-OES)
-
Luesaiwong, W. and Markus, R. (2004) Depth-resolved analysis of Ni-P plated aluminium hard disks by radio frequency glow discharge optical emission spectroscopy (rf-GD-OES) J. Anal. Atom. Spectrom., 19, pp. 345-353.
-
(2004)
J. Anal. Atom. Spectrom.
, vol.19
, pp. 345-353
-
-
Luesaiwong, W.1
Markus, R.2
-
30
-
-
0033887277
-
Influence of argon pressure on the depth resolution during GDOES depth profiling analysis of thin films
-
Shimizu, K. and Habazaki, H. and Skeldon, P. and Thompson, G. and Wood, G. (2000) Influence of argon pressure on the depth resolution during GDOES depth profiling analysis of thin films Surf. Interface Anal., 29, pp. 151-155.
-
(2000)
Surf. Interface Anal.
, vol.29
, pp. 151-155
-
-
Shimizu, K.1
Habazaki, H.2
Skeldon, P.3
Thompson, G.4
Wood, G.5
-
31
-
-
0032715750
-
Impurity distributions in barrier anodic films on aluminium: A GDOES depth profiling study
-
Shimizu, K. and Brown, D. and Habazaki, H. and Kobayashi, K. and Skeldon, P. and Thompson, G. and Wood, G. (1999) Impurity distributions in barrier anodic films on aluminium: A GDOES depth profiling study Electrochim. Acta., 44, pp. 2297-2306.
-
(1999)
Electrochim. Acta.
, vol.44
, pp. 2297-2306
-
-
Shimizu, K.1
Brown, D.2
Habazaki, H.3
Kobayashi, K.4
Skeldon, P.5
Thompson, G.6
Wood, G.7
-
32
-
-
0036568091
-
Ionic transport in amorphous anodic titania stabilised by incorporation of silicon species
-
Habazaki, H. and Shimizu, K. and Ngata, S. and Skeldon, P. and Thompson, G. and Wood, G. (2002) Ionic transport in amorphous anodic titania stabilised by incorporation of silicon species Corrosion Sci., 44, pp. 1047-1055.
-
(2002)
Corrosion Sci.
, vol.44
, pp. 1047-1055
-
-
Habazaki, H.1
Shimizu, K.2
Ngata, S.3
Skeldon, P.4
Thompson, G.5
Wood, G.6
-
33
-
-
0032785178
-
Glow discharge optical emission spectroscopy (GDOES) depth profile analysis of anodic alumina films - A depth resolution study
-
Shimizu, K. and Brown, D. and Habazaki, H. and Kobayashi, K. and Skeldon, P. and Thompson, G. and Wood, G. (1999) Glow discharge optical emission spectroscopy (GDOES) depth profile analysis of anodic alumina films - A depth resolution study Surf. Interface Anal., 27, pp. 24-28.
-
(1999)
Surf. Interface Anal.
, vol.27
, pp. 24-28
-
-
Shimizu, K.1
Brown, D.2
Habazaki, H.3
Kobayashi, K.4
Skeldon, P.5
Thompson, G.6
Wood, G.7
-
34
-
-
0038605729
-
Glow discharge optical emission spectrometry: Moving towards reliable thin film analysis - A short review
-
Angeli, J. and Bengtson, A. and Bogaerts, A. and Hoffmann, V. and Hodoroaba, V.-D. and Steers, E. (2003) Glow discharge optical emission spectrometry: Moving towards reliable thin film analysis - A short review J. Anal. Atom. Spectrom., 18, pp. 670-679.
-
(2003)
J. Anal. Atom. Spectrom.
, vol.18
, pp. 670-679
-
-
Angeli, J.1
Bengtson, A.2
Bogaerts, A.3
Hoffmann, V.4
Hodoroaba, V.-D.5
Steers, E.6
-
35
-
-
3042635542
-
Rf-GDOES depth profiling analysis of a monolayer of thiourea adsorbed on copper
-
Shimizu, K. and Payling, R. and Habasaki, H. and Skeldon, P. and Thompson, G. (2004) Rf-GDOES depth profiling analysis of a monolayer of thiourea adsorbed on copper J. Anal. Atom. Spectrom., 19, pp. 692-695.
-
(2004)
J. Anal. Atom. Spectrom.
, vol.19
, pp. 692-695
-
-
Shimizu, K.1
Payling, R.2
Habasaki, H.3
Skeldon, P.4
Thompson, G.5
-
38
-
-
0035271491
-
Effect of optical interferences on BPSG profiles obtained with a GDOES
-
Kimura, S. and Mitsui, Y. (2001) Effect of optical interferences on BPSG profiles obtained with a GDOES Appl. Spectros., 55(3), pp. 292-297.
-
(2001)
Appl. Spectros.
, vol.55
, Issue.3
, pp. 292-297
-
-
Kimura, S.1
Mitsui, Y.2
-
40
-
-
0032595796
-
Nonuniform sputtering and degradation of depth resolution during GDOES depth profile analysis of thin anodic alumina films grown of rough substrates
-
Shimizu, K. and Habasaki, H. and Speldon, P. and Thompson, G. and Wood, G. (1999) Nonuniform sputtering and degradation of depth resolution during GDOES depth profile analysis of thin anodic alumina films grown of rough substrates Surf. Interface Anal., 27, pp. 950-954.
-
(1999)
Surf. Interface Anal.
, vol.27
, pp. 950-954
-
-
Shimizu, K.1
Habasaki, H.2
Speldon, P.3
Thompson, G.4
Wood, G.5
-
42
-
-
0347180172
-
Ausbildung von Nitrirschichten beim Nitrocarburieren von Ventilen
-
Kurz, M. and Ittlinger, E. (1999) Ausbildung von Nitrirschichten beim Nitrocarburieren von Ventilen Prakt. Metallogr., 36, pp. 195-205.
-
(1999)
Prakt. Metallogr.
, vol.36
, pp. 195-205
-
-
Kurz, M.1
Ittlinger, E.2
-
43
-
-
1842444302
-
Oberflächen
-
Delfosse, D. and Aeberhard, M. and Sgobboda, S. (1998) Oberflächen Polysurfaces, 39(1), pp. 24-28.
-
(1998)
Polysurfaces
, vol.39
, Issue.1
, pp. 24-28
-
-
Delfosse, D.1
Aeberhard, M.2
Sgobboda, S.3
-
47
-
-
0032020866
-
Characterization of TiCN coatings deposited by magnetron sputter ion plating processes: RBS and GDOS complementary analysis
-
Freire, F., Jr. and Senna, L. and Achete, C. and Hirsch, T. (1998) Characterization of TiCN coatings deposited by magnetron sputter ion plating processes: RBS and GDOS complementary analysis Nucl. Instrum. Meth. Phys. Res. B, 136(8), pp. 788.
-
(1998)
Nucl. Instrum. Meth. Phys. Res. B
, vol.136
, Issue.8
, pp. 788
-
-
Freire Jr., F.1
Senna, L.2
Achete, C.3
Hirsch, T.4
-
48
-
-
0032179392
-
Homgeneity of multicomponent hard coatings studied by surface analysis depth profiling and model calculation
-
Jehn, H. (1998) Homgeneity of multicomponent hard coatings studied by surface analysis depth profiling and model calculation Surf. Interface Anal., 26, pp. 834.
-
(1998)
Surf. Interface Anal.
, vol.26
, pp. 834
-
-
Jehn, H.1
-
49
-
-
4243438588
-
Elemental depth profiling of coated and surface modified materials by GDOES: Hard coatings and cutting tools
-
Weiss, Z. and Marshall, K. (1998) Elemental depth profiling of coated and surface modified materials by GDOES: Hard coatings and cutting tools Thin Solid Films (308-309), pp. 382-388.
-
(1998)
Thin Solid Films
, Issue.308-309
, pp. 382-388
-
-
Weiss, Z.1
Marshall, K.2
-
50
-
-
0037899581
-
{100}-textured, piezoelectric Pb(Zr/sub x/,Ti/sub 1-x/)O/sub 3/thin films for MEMS: Integration, deposition and properties
-
Ledermann, N. and Muralt, P. and Baborowski, J. and Gentil, S. and Mukati, K. and Cantoni, M. and Seifert, A. and Setter, A. (2003) {100}-textured, piezoelectric Pb(Zr/sub x/,Ti/sub 1-x/)O/sub 3/thin films for MEMS: Integration, deposition and properties Sensors and Actuator Phy., 105, pp. 162.
-
(2003)
Sensors and Actuator Phy.
, vol.105
, pp. 162
-
-
Ledermann, N.1
Muralt, P.2
Baborowski, J.3
Gentil, S.4
Mukati, K.5
Cantoni, M.6
Seifert, A.7
Setter, A.8
-
51
-
-
0029521874
-
Characterization of PZT thin films for micromotors
-
Muralt, P. and Kholkin, A. and Kohli, M. and Maeder, T. and Setter, N. (1995) Characterization of PZT thin films for micromotors Microelectronic Engineering, 29, pp. 67.
-
(1995)
Microelectronic Engineering
, vol.29
, pp. 67
-
-
Muralt, P.1
Kholkin, A.2
Kohli, M.3
Maeder, T.4
Setter, N.5
-
52
-
-
0029491137
-
In-situ sputter deposition of PT and PZT films on platinum and RuO/sub 2/ electrodes
-
Maeder, T. and Muralt, P. and Sagalowicz, L. and Setter, N. (1995) In-situ sputter deposition of PT and PZT films on platinum and RuO/sub 2/ electrodes Microelectronic Engineering, 29, pp. 177.
-
(1995)
Microelectronic Engineering
, vol.29
, pp. 177
-
-
Maeder, T.1
Muralt, P.2
Sagalowicz, L.3
Setter, N.4
-
53
-
-
24644457613
-
Comparison of conventional and rapid thermal annealed PZT thin films deposited on Si wafers and optical fibers prepared by reactive DC pulsed magnetron sputtering from a metallic single target
-
Rhapliyal, R. and Schwaller, P. and Amberg, M. and Haug, F. and Fortunato, G. and Hegemann, D. and Hug, H. and Fischer, A.(2005) Comparison of conventional and rapid thermal annealed PZT thin films deposited on Si wafers and optical fibers prepared by reactive DC pulsed magnetron sputtering from a metallic single target. In Surf. Coat. Technol.. (pp. 1051-1056).
-
(2005)
Surf. Coat. Technol.
, pp. 1051-1056
-
-
Rhapliyal, R.1
Schwaller, P.2
Amberg, M.3
Haug, F.4
Fortunato, G.5
Hegemann, D.6
Hug, H.7
Fischer, A.8
-
54
-
-
33646043668
-
Rapid depth profiling of lead zirconate titanate (PZT) thin films by pulsedglow-discharge optical emission spectroscopy
-
(submitted)
-
Schwaller, P. and Aeberhard, M. and Nelis, T. and Fischer, A. and Thapliyal, R. and Michler, J.(2005) Rapid depth profiling of lead zirconate titanate (PZT) thin films by pulsedglow-discharge optical emission spectroscopy. In Surface Interface Anal.. (submitted)
-
(2005)
Surface Interface Anal.
-
-
Schwaller, P.1
Aeberhard, M.2
Nelis, T.3
Fischer, A.4
Thapliyal, R.5
Michler, J.6
-
55
-
-
0034467410
-
Surface chemical bonding states and ferroelectricity of Pb(Zr0.52Ti0.48)O3 thin films
-
Cho, C. (2000) Surface chemical bonding states and ferroelectricity of Pb(Zr0.52Ti0.48)O3 thin films Cryst. Res. Technol, 35, pp. 77-86.
-
(2000)
Cryst. Res. Technol
, vol.35
, pp. 77-86
-
-
Cho, C.1
-
56
-
-
0035121054
-
-
Song, Z. and Ren, W. and Fu, X. and Zhu, X. and Lin, C. and Yao, X. (2001) J. Phys. Condens. Matter, 13, pp. 155.
-
(2001)
J. Phys. Condens. Matter
, vol.13
, pp. 155
-
-
Song, Z.1
Ren, W.2
Fu, X.3
Zhu, X.4
Lin, C.5
Yao, X.6
-
57
-
-
0035474483
-
Polarization and self-polarization in thin PbZr/sub 1-x/Ti/sub x/O/sub 3/ (PZT) films
-
Afanasjev, V. and Petrov, A. and Pronin, I. and Tarakanov, E. and Kaptelov, E. and Graut, J. (2001) Polarization and self-polarization in thin PbZr/sub 1-x/Ti/sub x/O/sub 3/(PZT) films J. Phys. Condens. Matter, 13, pp. 8755.
-
(2001)
J. Phys. Condens. Matter
, vol.13
, pp. 8755
-
-
Afanasjev, V.1
Petrov, A.2
Pronin, I.3
Tarakanov, E.4
Kaptelov, E.5
Graut, J.6
-
58
-
-
0038703865
-
Compositional profiling of solution-deposited lead zirconate-titanate thin films by radio-frequency glow discharge/atomic emission spectroscopy rf-GD-AES
-
Marcus, R. and Schwartz, R. (2000) Compositional profiling of solution-deposited lead zirconate-titanate thin films by radio-frequency glow discharge/atomic emission spectroscopy rf-GD-AES Chem. Phys. Lett., 318, pp. 481-487.
-
(2000)
Chem. Phys. Lett.
, vol.318
, pp. 481-487
-
-
Marcus, R.1
Schwartz, R.2
-
59
-
-
28844443506
-
Single-target DC-pulsed deposition of lead zirconate titanate thin films: Investigation of the chemical and mechanical properties by glow-discharge optical emission spectroscopy and nanoindentation
-
Schwaller, P. and Thapliyal, R. and Aeberhard, M. and Michler, J. and Hug, H. and Fischer, A. (2005) Single-target DC-pulsed deposition of lead zirconate titanate thin films: Investigation of the chemical and mechanical properties by glow-discharge optical emission spectroscopy and nanoindentation Surf. Coat. Tech, 200, pp. 1566-1571.
-
(2005)
Surf. Coat. Tech
, vol.200
, pp. 1566-1571
-
-
Schwaller, P.1
Thapliyal, R.2
Aeberhard, M.3
Michler, J.4
Hug, H.5
Fischer, A.6
-
60
-
-
27844602373
-
Electrolytic deposition of valve metal oxide thin films as interference coatings on biomedical implants
-
Kern, P. and Schwaller, P. and Michler, J. (2005) Electrolytic deposition of valve metal oxide thin films as interference coatings on biomedical implants Thin Solid Films, 494, pp. 279-286.
-
(2005)
Thin Solid Films
, vol.494
, pp. 279-286
-
-
Kern, P.1
Schwaller, P.2
Michler, J.3
-
61
-
-
0028383855
-
Analysis of pigmented polymer coatings with rf-GDOES
-
Jones, D. and Payling, R. and Gower, S. and Boge, E. (1994) Analysis of pigmented polymer coatings with rf-GDOES J. Anal. At. Spectrom., 9, pp. 369-373.
-
(1994)
J. Anal. At. Spectrom.
, vol.9
, pp. 369-373
-
-
Jones, D.1
Payling, R.2
Gower, S.3
Boge, E.4
-
62
-
-
0002360120
-
Spectrochemical analysis of Medieval glasses by means of inductively coupled plasma and glow discharge sources
-
El Nady, A. and Zimmer, K. and Zaray, G. (1985) Spectrochemical analysis of Medieval glasses by means of inductively coupled plasma and glow discharge sources Spectrochim. Acta, 40B, pp. 999.
-
(1985)
Spectrochim. Acta
, vol.40 B
, pp. 999
-
-
El Nady, A.1
Zimmer, K.2
Zaray, G.3
-
63
-
-
0000328335
-
Characterisation of a radio frequency glow discharge source
-
Winchester, M. and Lazik, C. and Marcus, R. (1991) Characterisation of a radio frequency glow discharge source Spectrochim. Acta, 46B, pp. 483.
-
(1991)
Spectrochim. Acta
, vol.46 B
, pp. 483
-
-
Winchester, M.1
Lazik, C.2
Marcus, R.3
-
64
-
-
0031130213
-
Effect of discharge parameters on emission yield in a rf glow discharge atomic emission source
-
Parker, M. and Hartenstein, M. and Marcus, R. (1997) Effect of discharge parameters on emission yield in a rf glow discharge atomic emission source Spectrochim. Acta, 52B, pp. 567.
-
(1997)
Spectrochim. Acta
, vol.52 B
, pp. 567
-
-
Parker, M.1
Hartenstein, M.2
Marcus, R.3
-
65
-
-
0013120492
-
Atomic emission spectroscopy employing a pulsed radio frequency powered golw discharge
-
Pan, C. and King, F. (1993) Atomic emission spectroscopy employing a pulsed radio frequency powered golw discharge App. Spectros., 47(12), pp. 2095-2101.
-
(1993)
App. Spectros.
, vol.47
, Issue.12
, pp. 2095-2101
-
-
Pan, C.1
King, F.2
-
67
-
-
18844382958
-
The effect of thin conductive layers on glass on the performance of radiofrequency glow discharge optical emission spectrometry
-
Fernandez, B. and Bordel, N. and Pereiro, R. and Sanz-Medel, A. (2005) The effect of thin conductive layers on glass on the performance of radiofrequency glow discharge optical emission spectrometry J. Anal. Atom. Spectrom., 20, pp. 462-466.
-
(2005)
J. Anal. Atom. Spectrom.
, vol.20
, pp. 462-466
-
-
Fernandez, B.1
Bordel, N.2
Pereiro, R.3
Sanz-Medel, A.4
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