Glow discharge optical emission spectrometry: Moving towards reliable thin film analysis - A short review

Journal of Analytical Atomic Spectrometry

Volumn 18, Issue 6, 2003, Pages 670-679

  Angeli, Johann ^a   Bengtson, Arne ^b   Bogaerts, Annemie ^c   Hoffmann, Volker ^d   Hodoroaba, Vasile Dan ^e   Steers, Edward ^f  

^a VOESTALPINE STAHL GMBH   (Austria)

^b SWEREA KIMAB   (Sweden)

^c UNIVERSITY OF ANTWERP   (Belgium)

^d IFW DRESDEN   (Germany)

^e BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^f LONDON METROPOLITAN UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COATINGS; EMISSION SPECTROSCOPY; GLOW DISCHARGES; LIGHT EMISSION; THIN FILMS;

GLOW DISCHARGE OPTICAL EMISSION SPECTROSCOPY (GD-OES);

SPECTROSCOPIC ANALYSIS;

EID: 0038605729     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/b301293j     Document Type: Article

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