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Volumn 51, Issue 12, 1996, Pages 1451-1462

The formation of trace element-enriched particulates during laser ablation of refractory materials

Author keywords

Element enrichment; Fractionation; Laser ablation; Signal spikes; Zone refinement

Indexed keywords

COMPOSITION EFFECTS; FRACTIONATION; IONIZATION OF SOLIDS; MASS SPECTROMETRY; PARTICLE SIZE ANALYSIS; PARTICLES (PARTICULATE MATTER); PLASMAS; REFRACTORY MATERIALS; SCANNING ELECTRON MICROSCOPY; TRACE ELEMENTS; ZONE MELTING;

EID: 0030261910     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/0584-8547(96)01542-X     Document Type: Article
Times cited : (71)

References (20)
  • 9
    • 0043028681 scopus 로고
    • Trent University, unpublished material
    • P. Outridge and R.D. Evans, Trent University, unpublished material, 1994.
    • (1994)
    • Outridge, P.1    Evans, R.D.2
  • 10
    • 0037559236 scopus 로고
    • Trace Elements in a Glass Matrix, US Dept. of Commerce, Washington
    • National Bureau of Standards, Certificate of Analysis, Standard Reference Material 610, Trace Elements in a Glass Matrix, US Dept. of Commerce, Washington, 1982.
    • (1982) Certificate of Analysis, Standard Reference Material , vol.610
  • 11
    • 0042527719 scopus 로고    scopus 로고
    • personal communication
    • A. Tsai, personal communication, 1996.
    • (1996)
    • Tsai, A.1
  • 15
    • 0003709332 scopus 로고
    • Electron-microprobe analysis
    • J.L. Jambor and D.J. Vaughan (Eds.), Mineralogical Assoc. Canada, Ottawa, Ont.
    • D.C. Harris, Electron-Microprobe Analysis, in J.L. Jambor and D.J. Vaughan (Eds.), Advanced Microscopic Studies of Ore Minerals, Mineralogical Assoc. Canada, Ottawa, Ont., 1990, pp. 319-339.
    • (1990) Advanced Microscopic Studies of Ore Minerals , pp. 319-339
    • Harris, D.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.