A critical assessment of laser ablation ICP-MS as an analytical tool for depth analysis in silica-based glass samples

Journal of Analytical Atomic Spectrometry

Volumn 14, Issue 8, 1999, Pages 1143-1153

  Mank, Arjan J G ^a,b   Mason, Paul R D ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

^b UTRECHT UNIVERSITY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

LASER ABLATION; MASS SPECTROMETRY; PLASMA APPLICATIONS; TRACE ANALYSIS; TRACE ELEMENTS;

DEPTH PROFILING; INDUCTIVELY-COUPLED PLASMAS (ICP);

FUSED SILICA;

EID: 0032624589     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/a903304a     Document Type: Article

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