Column ratio mapping: A processing technique for atomic resolution high-angle annular dark-field (HAADF) images

Ultramicroscopy

Volumn 109, Issue 1, 2008, Pages 61-69

  Robb, Paul D ^a,b   Craven, Alan J ^a,b  

^a UNIVERSITY OF GLASGOW   (United Kingdom)

^b DARESBURY LABORATORY   (United Kingdom)

Author keywords

Column ratio mapping; High angle annular dark field (HAADF) imaging; Image processing

Indexed keywords

ABERRATIONS; ATOMIC PHYSICS; ATOMS; AUTOMATION; COLUMNS (STRUCTURAL); CONFORMAL MAPPING; DIGITAL IMAGE STORAGE; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGE ENHANCEMENT; IMAGE PROCESSING; IMAGING SYSTEMS; MICROSCOPIC EXAMINATION; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; ZINC;

AREAS OF INTERESTS; ATOMIC COLUMNS; ATOMIC RESOLUTIONS; AUTOMATED PROCESSES; COLUMN RATIO MAPPING; COMPOSITIONAL DISTRIBUTIONS; HIGH RESOLUTIONS; HIGH-ANGLE ANNULAR DARK-FIELD (HAADF) IMAGING; IMAGE PROCESSING TECHNIQUES; INTENSITY RATIOS; INTERFACIAL STRUCTURES; PROCESSING TECHNIQUES; RESOLUTION CAPABILITIES; SCANNING TRANSMISSION ELECTRON MICROSCOPIES; SINGLE INTENSITIES; STATISTICAL ANALYSIS; SUPERSTEM;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

ARTICLE; FOURIER TRANSFORMATION; IMAGE PROCESSING; IMAGING SYSTEM; OPTICAL RESOLUTION; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

EID: 55949126872     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.08.001     Document Type: Article

References (35)

1. Haider M., Rose H., Uhlemann S., Schwan E., Kabius B., and Urban K. Ultramicroscopy 75 (1998) 53
2. Batson P.E. Ultramicroscopy 96 (2003) 239
3. Dellby N., Krivanek O.L., Nellist P.D., Batson P.E., and Lupini A.R. J. Microsc. 50 3 (2001) 177
4. Valera M., Lupini A.R., van Benthem K., Borisevich A.Y., Chisholm M.F., Shibata N., Abe E., and Pennycook S.J. Annu. Rev. Mater. Res. 35 (2005) 359
5. Krivanek O.L., Dellby N., and Lupini A.R. Ultramicroscopy 78 (1999) 1
6. Krivanek O.L., Nellist P.D., Dellby N., Murfitt M.F., and Szilagyi Z. Ultramicroscopy 96 (2003) 229
7. Davies J.H. The Physics of Low-Dimensional Semiconductors (2005), Cambridge University Press, Cambridge
8. Pennycook S.J., and Jesson D.E. Phys. Rev. Lett. 64 6 (1990)
9. Pennycook S.J., and Jesson D.E. Ultramicroscopy 37 (1991) 14
10. Pennycook S.J., Rafferty B., and Nellist P.D. Microsc. Microanal. 6 (2000) 343
11. Rafferty B., Nellist P., and Pennycook J. J. Electron Microsc. 50 (2001) 227
12. Nellist P.D., and Pennycook S.J. Scanning Microsc. 11 (1997) 81
13. Ikarashi N., and Ishida K. J. Mater. Sci.: Mater. Electron. 7 (1996) 285
14. Larkner H., Bollig B., Ungerechts S., and Kubalek E. J. Phys. D: Appl. Phys. 29 (1996) 1767
15. Neumann W. Mater. Chem. Phys. 81 (2003) 364
16. Loane R.F., Xu P., and Silcox J. Ultramicroscopy 40 (1992) 121
17. Cheng K.Y. Proc. IEEE 85 11 (1997)
18. Klenov D.O., and Stemmer S. Ultramicroscopy 106 (2006) 889
19. Treacy M.M.J. Ultramicroscopy 52 (1993) 31
20. Plamann T., and Hytch M.J. Ultramicroscopy 78 (1999) 153
21. Hillyard S., Loane R.F., and Silcox J. Ultramicroscopy 49 (1993) 14
22. Cowley J.M., and Huang Y. Ultramicroscopy 40 (1992) 171
23. Hillyard S., and Silcox J. Ultramicroscopy 58 (1995) 6
24. Klenov D.O., Findlay S.D., and Allen L.J. Phys. Rev. B 76 (2007) 014111
25. Boothroyd C.B. J. Microsc. 190 (1998) 99
26. Boothroyd C.B., and Dunin-Borkowski R.E. Ultramicroscopy 98 (2004) 115
27. Dwyer C., and Etheridge J. Ultramicroscopy 96 (2003) 343
28. Scott C.P., Craven A.J., Hatto P., and Davies C. J. Microsc. 182 Pt 3 (1996) 186
29. Nag B.R. Semicond. Sci. Technol. 19 (2004) 162
30. Stradling R.A., and Klipstein P.C. Growth and Characterisation of Semiconductors (1991), Adam Hilger, Bristol
31. Egerton R.F. Electron Energy-Loss Spectroscopy in the Electron Microscope. second ed. (1996), Plenum Press, New York
32. Kim Y.-M., Jeong J.-M., Kim J.-G., and Kim Y.-J. J. Korean Phys. Soc. 48 2 (2006) 250
33. Galindo P.L., Kret S., Sanchez A.M., Laval J.-Y., Yanez A., Pizarro J., Guerrero E., Ben T., and Molina S.I. Ultramicroscopy 107 (2007) 1186
34. Kirkland E.J. Advanced Computing in Electron Microscopy (1998), Plenum Press, New York
35. Ikarashi N., and Ishida K. J. Mater. Sci.: Mater. Electron. 7 (1996) 285