Image processing of atomic resolution transmission electron microscope images

Journal of the Korean Physical Society

Volumn 48, Issue 2, 2006, Pages 250-255

  Kim, Young Min ^a   Jeong, Jong Man ^a   Kim, Jin Gyu ^a   Kim, Youn Joong ^a   Lim, Young Soo ^b  

^a Korea Basic Science Institute (KBSI)   (South Korea)

^b LG Chemical Ltd   (South Korea)

Author keywords

ARTEM; Atomic resolution; Fast fourier transform (FFT); Fourier mask filtering; Image processing

Indexed keywords

EID: 33644891062     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (19)

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