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Volumn 41, Issue 2, 2008, Pages 292-298

Blue and yellow luminescence of GaN nanocrystals-doped SiO2 matrix

Author keywords

Blue luminescence; GaN nanocrystal; PL; PLE; Yellow luminescence

Indexed keywords

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; III-V SEMICONDUCTORS; NANOCOMPOSITES; NANOCRYSTALLINE POWDERS; NANOCRYSTALS; OPTICAL DATA PROCESSING; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; SILICA; SURFACE DEFECTS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 55249090369     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physe.2008.07.010     Document Type: Article
Times cited : (7)

References (37)
  • 16
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    • Lutterotti, Matthies, Wenk, MAUD (Material Analysis Using Diffraction): a user friendly Java program for Rietveld texture analysis and more, National Research Council of Canada, Ottawa, 1999, pp. 1599-1604.
    • Lutterotti, Matthies, Wenk, MAUD (Material Analysis Using Diffraction): a user friendly Java program for Rietveld texture analysis and more, National Research Council of Canada, Ottawa, 1999, pp. 1599-1604.
  • 18
    • 0000953036 scopus 로고    scopus 로고
    • N.C. Popa, The (h k l) dependence of diffraction-line broadening caused by strain and size for all Laue groups in Rietveld refinement, JAC 31, 1998, pp. 176-180.
    • N.C. Popa, The (h k l) dependence of diffraction-line broadening caused by strain and size for all Laue groups in Rietveld refinement, JAC 31, 1998, pp. 176-180.
  • 19
    • 55249113956 scopus 로고    scopus 로고
    • Daniel Chateigner, Xiaolong Chen, Marco Ciriotti, Robert T. Downs, Saulius Gražulis, Armel Le Bail, Luca Lutterotti, Yoshitaka Matsushita, Peter Moeck, Miguel Quirós Olozábal, Hareesh Rajan, Alexandre F.T. Yokochi, Crystallography Open Database (COD): 〈www.crystallography.net〉, 2003.
    • Daniel Chateigner, Xiaolong Chen, Marco Ciriotti, Robert T. Downs, Saulius Gražulis, Armel Le Bail, Luca Lutterotti, Yoshitaka Matsushita, Peter Moeck, Miguel Quirós Olozábal, Hareesh Rajan, Alexandre F.T. Yokochi, Crystallography Open Database (COD): 〈www.crystallography.net〉, 2003.
  • 20
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    • D. Chateigner (Ed.), Combined analysis: structure-texture-microstructure-phase-stresses-reflectivity analysis by X-ray and neutron scattering, 2004, p. 147, 〈http://www.ecole.ensicaen.fr/~chateign/texture/combined.pdf〉.
    • D. Chateigner (Ed.), Combined analysis: structure-texture-microstructure-phase-stresses-reflectivity analysis by X-ray and neutron scattering, 2004, p. 147, 〈http://www.ecole.ensicaen.fr/~chateign/texture/combined.pdf〉.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.