X-ray combined QTA using a CPS applied to a ferroelectric ultrastructure

Materials Science Forum

Volumn 408-412, Issue I, 2002, Pages 113-118

  Morales, M ^a   Chateigner, D ^b   Lutterotti, L ^c   Ricote, J ^d  

^a UNIVERSITÉ DU MAINE   (France)

^b UNIVERSITÉ DE CAEN   (France)

^c UNIVERSITY OF TRENTO   (Italy)

^d INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

Ferroelectric Thin Film; Modified Lead Titanates; Structure; Texture; X Ray Diffraction Combined Approach

Indexed keywords

CRYSTALLOGRAPHY; SUBSTRATES; TEXTURES; X RAY DIFFRACTION ANALYSIS;

FERROELECTRIC ULTRASTRUCTURES;

FERROELECTRIC THIN FILMS;

EID: 0036952085     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.408-412.113     Document Type: Conference Paper

References (12)

1. J. F. Scott: Ferroelectric Memories, Springer Series in Advanced Microelectronics 3, (Springer-Verlag, Berlin Heidelberg 2000).
2. D.L. Polla and L.F. Francis: MRS Bull. Vol. 21(7) (1996), p. 59-65.
3. M. Ferrari, L. Lutterotti: J. Appl. Phys. Vol. 76(11) (1994), p. 7246-7255.
4. R. Sirera and M.L. Calzada: Mat. Res. Bull. Vol. 30(1) (1995), p. 11-18.
5. J. Ricote, D. Chateigner: Bol. Soc. Esp. Cerám. y Vidrio Vol. 38(6) (1999), p. 587-591.
6. J. Ricote, D. Chateigner, L. Pardo, M. Algueró, J. Mendiola and M.L. Calzada: Ferroelectrics Vol. 241 (2000), p. 167-174.
7. A. Le Bail, H. Duroy, J.-L. Fourquet: Mater. Res. Bull. Vol. 23 (1988), p. 447-452.
8. S. Matthies and G.W. Vinel: Phys. Stat. Sol. B Vol. 112 (1982), p. K111-K120.
9. L. Yansheng, W. Fu, X. Jiazheng, L. Zhide: J. Appl. Cryst. Vol. 26 (1993), p. 268-271.
10. L. Lutterotti, S. Matthies, H.-R. Wenk: Textures of Materials (NRC Research Press J.A. Szpunar Ed.) Vol. 2 (1999), p. 1599-1604.
11. A. Tizliouine, J. Bessières, J.-J. Heizmann, J.F. Bobo: Mat. Sci. For. Vol. 157 (1994), p. 227-234.
12. J.-J. Heizmann, C. Laruelle: J. of Appl. Cryst. Vol. 19 (1986), p. 467-472.