The (hkl) Dependence of Diffraction-Line Broadening Caused by Strain and Size for all Laue Groups in Rietveld Refinement

Journal of Applied Crystallography

Volumn 31, Issue 2, 1998, Pages 176-180

  Popa, N C ^a  

^a NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000953036     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889897009795     Document Type: Article

References (11)

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2. Delhez, R., de Keijser, Th. H. ,Langford, J. I., Louer, D., Mittemeijer, E. J. & Sonneveld, E. J. (1993). The Rietveld Method, edited by R. A. Young, pp. 132-166. New York: Oxford University Press.
3. Ferrari, M. & Lutterotti, L. (1994). J. Appl. Phys. 76, 7246-7255.
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5. Keijser, Th. H. de, Mittemeijer, E. J. & Rozendaal, H. C. F. (1983). J. Appl. Cryst. 16, 309-316.
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8. Lutterotti, L. & Scardi, P. (1990). J. Appl. Cryst. 23, 246-252.
9. Popa, N. C. (1992). J. Appl. Cryst. 25, 611-616.
10. Thompson, P., Reilly, J. J. & Hastings, J. M. (1987). J. Less Common Met. 129, 105-114.
11. Warren, B. E. (1969). X-Ray Diffraction, pp. 275-313. Reading, Massachusetts: Addison-Wesley.