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Volumn 55, Issue 8, 2008, Pages 2157-2165

Laser fine-tuneable deep-submicrometer CMOS 14-bit DAC

Author keywords

Analog integrated circuits; Calibration; CMOS; Data converter; Digital analog conversion (DAC); Laser trimming; Linearity; R2R ladder

Indexed keywords

ANALOG INTEGRATED CIRCUITS; CALIBRATION; CMOS INTEGRATED CIRCUITS; DIGITAL TO ANALOG CONVERSION; LADDERS; SYSTEM-ON-CHIP; TRIMMING;

EID: 54749117064     PISSN: 10577122     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCSI.2008.920152     Document Type: Article
Times cited : (22)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.