A 16-bit resistor string DAC with full-calibration at final test

Proceedings - International Test Conference

Volumn 2005, Issue , 2005, Pages 66-75

  Parthasarathy, Kumar ^a   Kuyel, Turker ^a   Zhongjun, Yu ^b   Degang, Chen ^b   Geiger, Randy ^b  

^a TEXAS INSTRUMENTS   (United States)

^b IOWA STATE UNIVERSITY   (United States)

Author keywords

DAC calibration; DAC testing; Data converters

Indexed keywords

DAC CALIBRATION; DAC TESTING; DATA CONVERTERS;

DATA STORAGE EQUIPMENT; ERROR ANALYSIS; INTERPOLATION; LINEARIZATION; RESISTORS;

TRANSFER FUNCTIONS;

EID: 33847127841     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2005.1583962     Document Type: Conference Paper

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