Clock feedthrough in CMOS analog transmission gate switches

Proceedings of the Annual IEEE International ASIC Conference and Exhibit

Volumn , Issue , 2002, Pages 181-185

  Xu, Weize ^a   Friedman, Eby G ^a  

^a University of Rochester   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CAPACITORS; CLOCKS; ELECTRIC SWITCHES;

CLOCK FEEDTHROUGH; CMOS ANALOG; COUPLING ERRORS; CURRENT VOLTAGE; GATE CAPACITORS; GATE VOLTAGES; SAMPLE-AND-HOLD; TRANSMISSION GATE;

MOSFET DEVICES;

EID: 67649115124     PISSN: 10630988     EISSN: None     Source Type: Journal    
DOI: 10.1109/ASIC.2002.1158052     Document Type: Article

References (5)

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2. B. Sheu and C. Hu, "Switch-Induced Error Voltage on a Switched Capacitor," IEEE Journal of Solid-State Circuits, Vol. SC-19, No. 4, pp. 519-525, August 1984
3. J. H. Shieh, M. Paul, and B. J. Sheu, "Modeling Charge Injection in MOS Analog Switches," IEEE Transactions on Circuits and Systems, Vol. CAS-34, No. 2, pp. 214-216, February 1987
4. G Wagmann and E. Vittoz, "Charge Injection in Analog MOS Switches," IEEE Journal of Solid-State Circuits, Vol. SC-22, No. 6, pp. 1091-1097, December 1987
5. Y. B. Gu and M. J. Chen, "A New Quantitative Model for Weak Inversion Charge Injection in MOSFET Analog Switches," IEEE Transactions on Electron Devices, Vol. 43, No. 2, pp. 295-301, February 1996