-
1
-
-
0018494118
-
-
26, pp. 440-457, July 1979.
-
N. Navid and A.N. Willson, A theory and an algorithm for analog circuit fault diagnosis, IEEE Trans. Circuits Syst., vol. 26, pp. 440-457, July 1979.
-
And A.N. Willson, A Theory and An Algorithm for Analog Circuit Fault Diagnosis, IEEE Trans. Circuits Syst., Vol.
-
-
Navid, N.1
-
2
-
-
0018496008
-
-
26, pp. 466-474, July 1979.
-
T. Trick, W. Mayeda, and A.A. Sakla, Calculation of parameter values from node voltage measurements, IEEE Trans. Circuits Syst., vol. 26, pp. 466-474, July 1979.
-
W. Mayeda, and A.A. Sakla, Calculation of Parameter Values from Node Voltage Measurements, IEEE Trans. Circuits Syst., Vol.
-
-
Trick, T.1
-
3
-
-
0019635998
-
-
28, pp. 1093-1102, Nov. 1981.
-
V. Visvanathan and A. Sangiovanni-Vincentelli, Diagnosability of nonlinear circuits and systems - Part I: The dc case, IEEE Trans. Circuits Syst., vol. 28, pp. 1093-1102, Nov. 1981.
-
And A. Sangiovanni-Vincentelli, Diagnosability of Nonlinear Circuits and Systems - Part I: the Dc Case, IEEE Trans. Circuits Syst., Vol.
-
-
Visvanathan, V.1
-
4
-
-
0019633001
-
-
28, pp. 1103-1108, Nov. 1981.
-
R. Sacks, A. Sangiovanni-Vincentelli, and V. Visvanathan, Diagnosability of nonlinear circuits and systems - Part II: Dynamical systems, IEEE Trans. Circuits Syst., vol. 28, pp. 1103-1108, Nov. 1981.
-
A. Sangiovanni-Vincentelli, and V. Visvanathan, Diagnosability of Nonlinear Circuits and Systems - Part II: Dynamical Systems, IEEE Trans. Circuits Syst., Vol.
-
-
Sacks, R.1
-
5
-
-
0022107260
-
-
73, pp. 1279-1325, Aug. 1985.
-
J.W. Bandler and A. E. Salama, Fault diagnosis of analog circuits, Proc. IEEE, vol. 73, pp. 1279-1325, Aug. 1985.
-
And A. E. Salama, Fault Diagnosis of Analog Circuits, Proc. IEEE, Vol.
-
-
Bandler, J.W.1
-
6
-
-
0026397966
-
-
40, pp. 930-935, Dec. 1991.
-
R. Carmassi, M. Catelani, G. Iuculano, A. Liberatore, S. Manetti, and M. Marini, Analog network testability measurement: A symbolic formulation approach, IEEE Trans. Instrum. Meas., vol. 40, pp. 930-935, Dec. 1991.
-
M. Catelani, G. Iuculano, A. Liberatore, S. Manetti, and M. Marini, Analog Network Testability Measurement: A Symbolic Formulation Approach, IEEE Trans. Instrum. Meas., Vol.
-
-
Carmassi, R.1
-
7
-
-
0024750674
-
-
38, pp. 941-947, Oct. 1989.
-
G.N. Stenbakken, T. M. Souders, and G. W. Stewart, Ambiguity groups and testability, IEEE Trans. Instrum. Meas., vol. 38, pp. 941-947, Oct. 1989.
-
T. M. Souders, and G. W. Stewart, Ambiguity Groups and Testability, IEEE Trans. Instrum. Meas., Vol.
-
-
Stenbakken, G.N.1
-
8
-
-
33749965160
-
-
1993: Selected Topics in Circuits and Systems, H. Dedieu, Ed. Amsterdam, The Netherlands: Elsevier, 1993, pp. 77-156.
-
J.L. Huertas, Test and design for testability of analog and mixed-signal integrated circuits: Theoretical basis and pragmatical approaches, in Circuit Theory and Design 1993: Selected Topics in Circuits and Systems, H. Dedieu, Ed. Amsterdam, The Netherlands: Elsevier, 1993, pp. 77-156.
-
Test and Design for Testability of Analog and Mixed-signal Integrated Circuits: Theoretical Basis and Pragmatical Approaches, in Circuit Theory and Design
-
-
Huertas, J.L.1
-
9
-
-
33749884662
-
-
3rd ed., Analog Devices, Inc., 1984.
-
CMOS DAC Application Guide, 3rd ed., Analog Devices, Inc., 1984.
-
CMOS DAC Application Guide
-
-
-
11
-
-
33749875179
-
-
30-Sept. 3 1997, pp. Late 16-1-Late 16-6.
-
M.P. Kennedy, Experimental determination of mismatch errors in R-2R DAC's, in Proc. ECCTD'97, Budapest, Hungary, Aug. 30-Sept. 3 1997, pp. Late 16-1-Late 16-6.
-
Experimental Determination of Mismatch Errors in R-2R DAC's, in Proc. ECCTD'97, Budapest, Hungary, Aug.
-
-
Kennedy, M.P.1
-
13
-
-
0003507750
-
-
3rd ed., D.H. Sheingold, Ed., Prentice-Hall, Englewood Cliffs, NJ, 1986.
-
Analog-Digital Conversion Handbook, 3rd ed., D.H. Sheingold, Ed., Prentice-Hall, Englewood Cliffs, NJ, 1986.
-
Analog-Digital Conversion Handbook
-
-
|