Ion track structure and dynamics in SiO2

IEEE Transactions on Nuclear Science

Volumn 55, Issue 4, 2008, Pages 2113-2120

  Murat, M ^a   Akkerman, A ^a   Barak, J ^a  

^a SOREQ NUCLEAR RESEARCH CENTER   (Israel)

Author keywords

Charge radial distribution; Microdose and straggling effects; Monte Carlo simulation; Time evolution of track structure

Indexed keywords

CHARGE RADIAL DISTRIBUTION; MICRODOSE AND STRAGGLING EFFECTS; MONTE CARLO SIMULATION; TIME EVOLUTION OF TRACK STRUCTURE;

SILICON COMPOUNDS;

EID: 53349145782     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2008.921937     Document Type: Conference Paper

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