Microdose induced data loss on floating gate memories

IEEE Transactions on Nuclear Science

Volumn 53, Issue 6, 2006, Pages 3518-3524

  Guertin, Steven M ^a   Nguyen, Duc N ^a   Patterson, Jeffrey D ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Flash; Floating gate; Microdose; SEU

Indexed keywords

DATA STORAGE EQUIPMENT; FLASH MEMORY; HEAVY IONS; STATISTICAL METHODS;

DATA LOSS; FLOATING GATE; FLOATING GATE MEMORIES; HEAVY ION IRRADIATION; SEU;

GATES (TRANSISTOR);

EID: 33846322169     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2006.885861     Document Type: Conference Paper

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