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Volumn 49 I, Issue 6, 2002, Pages 2810-2817

Dose and microdose measurement based on threshold shifts in MOSFET arrays in commercial SRAMs

Author keywords

Microdose; Oxide damage; Single event effect; Single hard error (SHE); SRAM; Stuck bit

Indexed keywords

DIGITAL SIGNAL PROCESSING; DOSIMETRY; ELECTROMAGNETIC WAVE ABSORPTION; IONIZING RADIATION; STATIC RANDOM ACCESS STORAGE; THRESHOLD VOLTAGE;

EID: 0036947626     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2002.805445     Document Type: Conference Paper
Times cited : (16)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.