A method to improve tracking and particle identification in TPCs and silicon detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 562, Issue 1, 2006, Pages 154-197

  Bichsel, Hans ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

Author keywords

Energy loss; Ionization; Particle identification; Tracking

Indexed keywords

CHARGED PARTICLES; DETECTORS; ENERGY DISSIPATION; IONIZATION; RANDOM PROCESSES; SILICON;

CHARGED PARTICLE IDENTIFICATION (PID); PARTICLE IDENTIFICATION; SILICON DETECTORS; TIME PROJECTION CHAMBERS (TPCS);

PARTICLE BEAM TRACKING;

EID: 33646769620     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2006.03.009     Document Type: Review

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