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Volumn , Issue , 2007, Pages 129-136

Evaluating voltage islands in CMPs under process variations

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POWER UTILIZATION; LANDFORMS; NETWORKS (CIRCUITS);

EID: 52949088635     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCD.2007.4601891     Document Type: Conference Paper
Times cited : (17)

References (25)
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    • The R project for statistical
    • The R project for statistical, computing, http://www.r-project.org.
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    • Impact of die-to -die and within-die parameter fluctuations on the maximum clock frequency distribution for gigascale integration
    • Feb
    • K. A. Bowman and J. D. Meindl. Impact of die-to -die and within-die parameter fluctuations on the maximum clock frequency distribution for gigascale integration. IEEE Journal of Solid State Electronics, 37(2), Feb. 2002.
    • (2002) IEEE Journal of Solid State Electronics , vol.37 , Issue.2
    • Bowman, K.A.1    Meindl, J.D.2
  • 6
    • 4444264520 scopus 로고    scopus 로고
    • Novel sizing algorithm for yield improvement under process variation in nanometer technology
    • San Diego, CA
    • S. H. Choi, B. C. Paul, and K. Roy. Novel sizing algorithm for yield improvement under process variation in nanometer technology. In Proc. of the Design Automation Conference, pages 454-459. San Diego, CA, 2004.
    • (2004) Proc. of the Design Automation Conference , pp. 454-459
    • Choi, S.H.1    Paul, B.C.2    Roy, K.3
  • 16
    • 52949144800 scopus 로고    scopus 로고
    • The impact of systematic process variations on symmetrical performance in chip multi-processors
    • April
    • E. Humenay, D. Tarjan, and K. Skadron. The impact of systematic process variations on symmetrical performance in chip multi-processors. In Design, Automation and Test in Europe (DATE), April 2007.
    • (2007) Design, Automation and Test in Europe (DATE)
    • Humenay, E.1    Tarjan, D.2    Skadron, K.3
  • 18
    • 46149102490 scopus 로고    scopus 로고
    • System-level process-driven variability analysis for single and multiple voltage-frequency island systems
    • Nov
    • D. Marculescu and S. Garg. System-level process-driven variability analysis for single and multiple voltage-frequency island systems. In International Conference on Computer-Aided Design (ICCAD), Nov. 2006.
    • (2006) International Conference on Computer-Aided Design (ICCAD)
    • Marculescu, D.1    Garg, S.2
  • 20
    • 0034833288 scopus 로고    scopus 로고
    • Modeling and analysis of manufacturing variations
    • San Diego, CA, May
    • S. Nassif. Modeling and analysis of manufacturing variations. In IEEE Conference on Custom Integrated Circuits, pages 223-228, San Diego, CA, May 2001.
    • (2001) IEEE Conference on Custom Integrated Circuits , pp. 223-228
    • Nassif, S.1
  • 23
    • 1542269365 scopus 로고    scopus 로고
    • Statistical estimation of leakage current considering inter- and intra-die process variation
    • Seoul, Korea
    • R. Rao, A. Srivastava, D. Blaauw, and D. Sylvester. Statistical estimation of leakage current considering inter- and intra-die process variation. In ISLPED '03, Seoul, Korea, 2003.
    • (2003) ISLPED '03
    • Rao, R.1    Srivastava, A.2    Blaauw, D.3    Sylvester, D.4
  • 24
    • 24344445513 scopus 로고    scopus 로고
    • R. R. Rao, D. Blaauw, D. Sylvester, and A. Devgan. Modeling and analysis of parametric yield under power and performance constraints. IEEE Des. Test, 22(4):376-385, 2005.
    • R. R. Rao, D. Blaauw, D. Sylvester, and A. Devgan. Modeling and analysis of parametric yield under power and performance constraints. IEEE Des. Test, 22(4):376-385, 2005.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.