메뉴 건너뛰기




Volumn 2006, Issue , 2006, Pages 712-717

Speed binning aware design methodology to improve profit under parameter variations

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CONSTRAINT THEORY; COST ACCOUNTING; PARAMETER ESTIMATION; PRODUCT DEVELOPMENT;

EID: 33748605292     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1118299.1118466     Document Type: Conference Paper
Times cited : (32)

References (14)
  • 1
    • 0036474722 scopus 로고    scopus 로고
    • Impact of die-to-die and within-die parameter fluctuations on the maximum clock frequency distribution for oigascale integration
    • K. A. Bowman et al., "Impact of Die-to-Die and Within-Die Parameter Fluctuations on the Maximum Clock Frequency Distribution for Oigascale Integration", JSSC, 2002, pp. 183-190.
    • (2002) JSSC , pp. 183-190
    • Bowman, K.A.1
  • 2
    • 0034507816 scopus 로고    scopus 로고
    • A new framework for static timing analysis, incremental timing refinement, and timing simulation
    • L.-C. Chen et al., "A New Framework for Static Timing Analysis, Incremental Timing Refinement, and Timing Simulation", ATS, 2000, pp. 102-107.
    • (2000) ATS , pp. 102-107
    • Chen, L.-C.1
  • 3
    • 0041633858 scopus 로고    scopus 로고
    • Parameter variations and impact on circuits and micro-architecture
    • S. Borkar et al., "Parameter Variations and Impact on Circuits and Micro-architecture", DAC, 2003, pp. 338-342.
    • (2003) DAC , pp. 338-342
    • Borkar, S.1
  • 4
    • 0142135003 scopus 로고    scopus 로고
    • Speed binning with path delay test in 150-nm technology
    • B. Cory et al., "Speed binning with path delay test in 150-nm technology", IEEE Design and Test of Computers, 2003, pp. 41-45.
    • (2003) IEEE Design and Test of Computers , pp. 41-45
    • Cory, B.1
  • 5
    • 4444351567 scopus 로고    scopus 로고
    • Parametric yield estimation considering leakage variability
    • R. R. Rao et al., "Parametric Yield Estimation Considering Leakage variability", DAC, 2004, pp. 442-447.
    • (2004) DAC , pp. 442-447
    • Rao, R.R.1
  • 6
    • 4444264520 scopus 로고    scopus 로고
    • Novel sizing algorithm for yield improvement under process variation in nanometer technology
    • S. Choi et al., "Novel Sizing Algorithm for Yield Improvement under Process Variation in Nanometer Technology", DAC, 2004, pp. 454-459.
    • (2004) DAC , pp. 454-459
    • Choi, S.1
  • 7
    • 0032685389 scopus 로고    scopus 로고
    • Fast and exact simultaneous gate and wire sizing by lagrangian relaxation
    • C. P. Chen et al., "Fast and Exact Simultaneous Gate and Wire Sizing by Lagrangian Relaxation," IEEE TCAD, 1999, pp. 1014-1025.
    • (1999) IEEE TCAD , pp. 1014-1025
    • Chen, C.P.1
  • 8
    • 33646912201 scopus 로고    scopus 로고
    • Statistical timing analysis using levelized covariance propagation
    • K. Kang et al., "Statistical Timing Analysis using Levelized Covariance Propagation", DATE, 2005, pp. 764-769.
    • (2005) DATE , pp. 764-769
    • Kang, K.1
  • 9
    • 33748583334 scopus 로고    scopus 로고
    • "Technology Models", http:/www-device.eecs.berkeley.edu/~ptm.
    • Technology Models
  • 10
    • 27944476890 scopus 로고    scopus 로고
    • Circuit optimization using statistical timing analysis
    • A. Agarwal et al., "Circuit Optimization using Statistical Timing Analysis", DAC, 2005, pp. 321-324.
    • (2005) DAC , pp. 321-324
    • Agarwal, A.1
  • 11
    • 0026106011 scopus 로고
    • Delay analysis of series-connected MOSFET circuits
    • T. Sakurai et al., "Delay Analysis of Series-connected MOSFET Circuits", IEEE JSSC, vol. 26, no. 2, 1991, pp. 122-131.
    • (1991) IEEE JSSC , vol.26 , Issue.2 , pp. 122-131
    • Sakurai, T.1
  • 12
    • 16244393708 scopus 로고    scopus 로고
    • Asymptotic probability extraction for non-normal distributions of circuit performance
    • X. Li et al., "Asymptotic Probability Extraction for Non-Normal Distributions of Circuit Performance", ICCAD, 2004, pp. 2-9.
    • (2004) ICCAD , pp. 2-9
    • Li, X.1
  • 13
    • 0036054545 scopus 로고    scopus 로고
    • Uncertainty-aware circuit optimization
    • X. Bai et al., "Uncertainty-Aware Circuit Optimization", DAC, 2002, pp. 58-63.
    • (2002) DAC , pp. 58-63
    • Bai, X.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.