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Volumn , Issue , 2006, Pages

Can carbon nanotubes extend the lifetime of on-chip electrical interconnections?

Author keywords

Carbon nanotubes; Copper; Interconnects; VLSI

Indexed keywords

COPPER INTERCONNECTS; CURRENT-CARRYING CAPACITY; ELECTRICAL INTERCONNECTIONS; ELECTRICAL INTERCONNECTS; INTERCONNECTS; INTERNATIONAL CONFERENCES; METALLIC CARBON NANOTUBES; NANO-NET; NANO-NETWORKS; ON CHIPS; RELIABILITY CONSTRAINTS; VLSI;

EID: 50149096475     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NANONET.2006.346235     Document Type: Conference Paper
Times cited : (7)

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