Intertube coupling in ropes of single-wall carbon nanotubes

Physical Review Letters

Volumn 85, Issue 24, 2000, Pages 5186-5189

  Stahl, H ^a   Appenzeller, J ^a   Martel, R ^b   Avouris, Ph ^b   Lengeler, B ^a  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; COMPUTER SIMULATION; DEFECTS; ELECTRIC RESISTANCE MEASUREMENT; ELECTRON TUNNELING; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; MATHEMATICAL MODELS; MONTE CARLO METHODS; ROPE; SPUTTERING; THERMAL EFFECTS;

CARBON NANOTUBE; DEFECT DENSITY; FOUR PROBE RESISTANCE MEASUREMENT; INTERTUBE COUPLING; SINGLE WALL CARBON NANOTUBES;

NANOTUBES;

EID: 0034428961     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.85.5186     Document Type: Article

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