A circuit model for carbon nanotube interconnects: Comparative study with Cu interconnects for scaled technologies

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

Volumn , Issue , 2004, Pages 237-240

  Raychowdhury, Arijit ^a   Roy, Kaushik ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

KINETIC INDUCTANCES; MULTI-WALLED CARBON NANOTUBES (MWCNT); SCALED TECHNOLOGIES; SEMICONDUCTING CARBON NANOTUBES (CNT);

CAPACITANCE; COMPUTER SIMULATION; CURRENT DENSITY; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; ELECTRON SCATTERING; FIELD EFFECT TRANSISTORS; GRAIN BOUNDARIES; INDUCTANCE; MATHEMATICAL MODELS; NETWORKS (CIRCUITS); OPTICAL INTERCONNECTS; THERMAL CONDUCTIVITY;

CARBON NANOTUBES;

EID: 16244369436     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2004.1382578     Document Type: Conference Paper

References (12)

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