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Volumn 17, Issue 7-10, 2008, Pages 1710-1715
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Investigations on electrical properties of a-C:H thin films deposited in a Microwave Multipolar Plasma reactor excited at Distributed Electron Cyclotron Resonance
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Author keywords
Amorphous hydrogenated carbon; Electrical conductivity; Electrical properties characterization; Plasma CVD
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Indexed keywords
AMORPHOUS CARBON;
AMORPHOUS FILMS;
CARBON FILMS;
CHEMICAL PROPERTIES;
CYCLOTRON RESONANCE;
CYCLOTRONS;
DISCHARGE (FLUID MECHANICS);
ELECTRIC PROPERTIES;
ELECTRON CYCLOTRON RESONANCE;
FLUID MECHANICS;
MAGNETISM;
METHANE;
MICROWAVES;
MOLECULAR BEAM EPITAXY;
PARTICLE ACCELERATORS;
PLASMA APPLICATIONS;
PLASMA DIAGNOSTICS;
PLASMAS;
RESONANCE;
THICK FILMS;
THIN FILMS;
AMORPHOUS HYDROGENATED CARBON;
DISTRIBUTED ELECTRON CYCLOTRON RESONANCE;
ELECTRICAL CONDUCTIVITY;
ELECTRICAL PROPERTIES;
ELECTRICAL PROPERTIES CHARACTERIZATION;
FILM DENSITY;
PHYSICO CHEMICALS;
PLASMA CVD;
PLASMA DISCHARGES;
PLASMA REACTORS;
PROCESS PARAMETERS;
ELECTRIC DISCHARGES;
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EID: 48849093285
PISSN: 09259635
EISSN: None
Source Type: Journal
DOI: 10.1016/j.diamond.2008.01.036 Document Type: Article |
Times cited : (11)
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References (32)
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