Small scale mechanical properties of polycrystalline materials: In situ diffraction studies

International Journal of Nanotechnology

Volumn 5, Issue 6-8, 2008, Pages 609-630

  Girault, B ^a,c   Vidal, V ^a,d   Thilly, L ^a,c,e   Renault, P O ^a,c   Goudeau, P ^a,f   Le Bourhis, E ^a   Villain Valat, P ^a,c,e   Geandier, G ^a,c   Tranchant, J ^a,b   Landesman, J P ^b,g   Tessier, P Y ^b,h   Angleraud, B ^b,g   Besland, M P ^a,b   Djouadi, A ^b,g   Lecouturier, F ^a,i  

^a CNRS   (France)

^b UNIVERSITÉ DE NANTES   (France)

^c UNIVERSITÉ DE POITIERS   (France)

^d CEMES CNRS   (France)

^e Laboratory of Physical Metallurgy   (France)

^f Laboratory of Physical Mgtallurgy   (France)

^g INSTITUT DES MATÉRIAUX JEAN ROUXEL   (France)

^h Institute of Materials Jean Rouxel Nantes   (France)

ⁱ National Laboratory of Pulsed Magnetic Field   (France)

Author keywords

Instrumentation; Nanomaterials; Simulation

Indexed keywords

BINARY ALLOYS; CHROMIUM ALLOYS; COPPER ALLOYS; DIFFRACTOMETERS; FILM PREPARATION; MECHANICAL PROPERTIES; MECHANISMS; MICROSTRUCTURE; MOLECULAR DYNAMICS; MOLYBDENUM ALLOYS; MULTILAYERS; NANOCOMPOSITE FILMS; NANOCOMPOSITES; NANOSTRUCTURED MATERIALS; NIOBIUM ALLOYS; PLASTIC DEFORMATION; POLYCRYSTALLINE MATERIALS; STRAIN GAGES; TANTALUM ALLOYS; TENSILE TESTING; TUNGSTEN ALLOYS;

ELASTIC AND PLASTIC DEFORMATION; INSTRUMENTATION; MECHANICAL CHARACTERISATION; MOLECULAR DYNAMICS SIMULATIONS; NANOSTRUCTURED THIN FILM; SEVERE PLASTIC DEFORMATIONS; SIMULATION; STRAIN STRESS RELATIONSHIP;

MATERIALS PROPERTIES;

EID: 45849135650     PISSN: 14757435     EISSN: None     Source Type: Journal    
DOI: 10.1504/IJNT.2008.018685     Document Type: Article

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