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Volumn 81, Issue 23, 2002, Pages 4365-4367

Size effect on intragranular elastic constants in thin tungsten films

Author keywords

[No Author keywords available]

Indexed keywords

ELASTIC MODULI; MICROSTRUCTURE; MULTILAYERS; NANOSTRUCTURED MATERIALS; POISSON RATIO; TENSILE TESTING; THIN FILMS; TUNGSTEN; X RAY DIFFRACTION ANALYSIS;

EID: 0037011608     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1527229     Document Type: Article
Times cited : (77)

References (16)
  • 12
    • 0012178298 scopus 로고    scopus 로고
    • Powder Diffraction Files No. 4-806 and No. 4-836 from the International Center for Diffraction Data (ICDD)
    • Powder Diffraction Files No. 4-806 and No. 4-836 from the International Center for Diffraction Data (ICDD).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.