Young's modulus measurements and grain boundary sliding in free-standing thin metal films

Applied Physics Letters

Volumn 78, Issue 18, 2001, Pages 2673-2675

  Kalkman, A J ^a   Verbruggen, A H ^a   Janssen, G C A M ^a,b  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b Laboratory of Materials Science   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035971709     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1367896     Document Type: Article

References (14)

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7. In the case of grain boundary sliding induced anelasticity, the process is usually characterized by a distribution of time constants. In this case, τ stands for the median of the distribution function.
8. Simultaneously, the phase angle θ(ω) = 1/Q(ω) with 1/Q(ω) as well the frequency dependent anelastic damping is obtained. These results will be discussed elsewhere.
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