Time-of-flight diffraction with multiple pulse overlap. Part I: The concept

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 545, Issue 1-2, 2005, Pages 319-329

  Stuhr, U ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

Residual stress; Strain scanner; Time of flight diffractometer

Indexed keywords

FREQUENCIES; INDUSTRIAL APPLICATIONS; NEUTRON DIFFRACTION; OPTIMIZATION; RESIDUAL STRESSES; STRAIN;

BRAGG REFLECTIONS; DIFFRACTION PATTERNS; STRAIN SCANNER; TIME-OF-FLIGHT DIFFRACTOMETER;

DIFFRACTOMETERS;

EID: 19144371235     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2005.01.320     Document Type: Article

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