Manipulation and imaging of individual single-walled carbon nanotubes with an atomic force microscope

Advanced Materials

Volumn 12, Issue 17, 2000, Pages 1299-1302

  Postma, Henk W C ^a   Sellmeijer, Allard ^a   Dekker, Cees ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BUCKLING; CARBON; DEFORMATION;

CARBON NANODUTBE JUNCTIONS;

NANOTUBES;

EID: 0034276088     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-4095(200009)12:17<1299::AID-ADMA1299>3.0.CO;2-O     Document Type: Article

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