Electronic characterization of Si(100)-bound alkyl monolayers using kelvin probe force microscopy

Journal of Physical Chemistry C

Volumn 112, Issue 18, 2008, Pages 7145-7150

  Magid, I ^a   Burstein, L ^a   Seitz, O ^b   Segev, L ^b   Kronik, L ^b   Rosenwaks, Y ^a  

^a TEL AVIV UNIVERSITY   (Israel)

^b WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; ELECTRONIC PROPERTIES; HYDROGENATION; SEMICONDUCTOR DOPING; SILICON;

KELVIN PROBE FORCE MICROSCOPY; ORGANIC MOLECULES; SELF-ASSEMBLY DEPOSITION;

MONOLAYERS;

EID: 43949140857     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp709973d     Document Type: Article

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