Local measurement of surface states energy distribution in semiconductors using Kelvin probe force microscope

Applied Physics Letters

Volumn 86, Issue 17, 2005, Pages 1-3

  Saraf, S ^a   Molotskii, M ^a   Rosenwaks, Y ^a  

^a TEL AVIV UNIVERSITY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CAPACITANCE; ELECTRIC POTENTIAL; FERMI LEVEL; INTEGRATION; MOSFET DEVICES; SCANNING TUNNELING MICROSCOPY;

CONTACTLESS METHODS; KELVIN PROBE FORCE MICROSCOPES; PHOTOEMISSION SPECTROSCOPY; SPACE CHARGE REGION (SCR);

SEMICONDUCTOR JUNCTIONS;

EID: 20844438829     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1906296     Document Type: Article

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