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Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 26, Issue 2, 2008, Pages 525-533

Defects in CdHgTe grown by molecular beam epitaxy on (211)B-oriented CdZnTe substrates

(7) Selvig, E a Tonheim, C R a Kongshaug, K O a Skauli, T a Hemmen, H a,b Lorentzen, T a Haakenaasen, R a

a NORWEGIAN DEFENCE RESEARCH ESTABLISHMENT FFI (Norway)

b Department of Physics ^* (Norway)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; EPILAYERS; MOLECULAR BEAM EPITAXY; SCANNING ELECTRON MICROSCOPY;

MICROVOIDS; TEMPERATURE RANGE;

CRYSTAL DEFECTS;

EID: 41549086113 PISSN: 10711023 EISSN: None Source Type: Journal
DOI: 10.1116/1.2868782 Document Type: Article

Times cited : (9)

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