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Volumn 25, Issue 6, 2007, Pages 1776-1784

Defects in HgTe grown by molecular beam epitaxy on (211)B-oriented CdZnTe substrates

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; EPITAXIAL GROWTH; GROWTH TEMPERATURE; MOLECULAR BEAM EPITAXY; OPTICAL MICROSCOPY; SCANNING ELECTRON MICROSCOPY;

EID: 37149022904     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2787876     Document Type: Article
Times cited : (14)

References (24)
  • 7
    • 0000858333 scopus 로고    scopus 로고
    • 0361-5235 10.1007/s11664-997-0217-2
    • T. Colin and T. Skauli, J. Electron. Mater. 0361-5235 10.1007/s11664-997-0217-2 26, 688 (1997).
    • (1997) J. Electron. Mater. , vol.26 , pp. 688
    • Colin, T.1    Skauli, T.2
  • 8
    • 37149051557 scopus 로고
    • Ph.D. thesis, Universit́ Joseph Fourier, Grenoble
    • T. Colin, Ph.D. thesis, Universit́ Joseph Fourier, Grenoble, 1991.
    • (1991)
    • Colin, T.1
  • 16
    • 0001499099 scopus 로고    scopus 로고
    • 0361-5235 10.1007/s11664-998-0027-1
    • L. H. Zhang and C. J. Summers, J. Electron. Mater. 0361-5235 10.1007/s11664-998-0027-1 27, 634 (1998).
    • (1998) J. Electron. Mater. , vol.27 , pp. 634
    • Zhang, L.H.1    Summers, C.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.