-
4
-
-
0035298656
-
-
Ji H.F., Thundat T., Dabestani R., Brown G.M., Britt P.F., and Bonnesen P.V. Anal. Chem. 73 (2001) 1572-1576
-
(2001)
Anal. Chem.
, vol.73
, pp. 1572-1576
-
-
Ji, H.F.1
Thundat, T.2
Dabestani, R.3
Brown, G.M.4
Britt, P.F.5
Bonnesen, P.V.6
-
5
-
-
0035298847
-
-
Hansen K.M., Ji H.F., Wu G., Datar R., Cote R., Majumadar A., and Thundat T. Anal. Chem. 73 7 (2001) 1567-1571
-
(2001)
Anal. Chem.
, vol.73
, Issue.7
, pp. 1567-1571
-
-
Hansen, K.M.1
Ji, H.F.2
Wu, G.3
Datar, R.4
Cote, R.5
Majumadar, A.6
Thundat, T.7
-
6
-
-
0035852777
-
-
Wu G., Ji H.F., Hansen K., Thundat T., Datar R., Cote R., Hagan M.F., Chakraborty A.K., and Majumdar A. Proc. Natl. Acad. Sci. USA 98 (2001) 1560-1564
-
(2001)
Proc. Natl. Acad. Sci. USA
, vol.98
, pp. 1560-1564
-
-
Wu, G.1
Ji, H.F.2
Hansen, K.3
Thundat, T.4
Datar, R.5
Cote, R.6
Hagan, M.F.7
Chakraborty, A.K.8
Majumdar, A.9
-
9
-
-
0034646725
-
-
Fritz J., et al. Science 288 (2000) 316-318
-
(2000)
Science
, vol.288
, pp. 316-318
-
-
Fritz, J.1
-
10
-
-
0036643750
-
-
Chatzandroulis S., Tserepi A., Goustouridis D., Normand P., and Tsoukalas D. Microelectron. Eng. 61-62 (2002) 955-961
-
(2002)
Microelectron. Eng.
, vol.61-62
, pp. 955-961
-
-
Chatzandroulis, S.1
Tserepi, A.2
Goustouridis, D.3
Normand, P.4
Tsoukalas, D.5
-
12
-
-
38949205491
-
-
.
-
.
-
-
-
-
15
-
-
0035982798
-
-
Boufnichel M., Aachboun S., Grangeon F., Lefaucheux P., and Ranson P. J. Vac. Sci. Technol. B 20 4 (2002) 1508-1512
-
(2002)
J. Vac. Sci. Technol. B
, vol.20
, Issue.4
, pp. 1508-1512
-
-
Boufnichel, M.1
Aachboun, S.2
Grangeon, F.3
Lefaucheux, P.4
Ranson, P.5
-
16
-
-
15344339765
-
-
Boufnichel M., Lefaucheux P., Aachboun S., Dussart R., and Ranson P. Microelectron. Eng. 77 (2005) 327-336
-
(2005)
Microelectron. Eng.
, vol.77
, pp. 327-336
-
-
Boufnichel, M.1
Lefaucheux, P.2
Aachboun, S.3
Dussart, R.4
Ranson, P.5
-
20
-
-
38949101040
-
-
F. Laermer, A. Schilp, Method of Anisotropically Etching Silicon, US Patent (1996) 5501893.
-
F. Laermer, A. Schilp, Method of Anisotropically Etching Silicon, US Patent (1996) 5501893.
-
-
-
-
21
-
-
0032636883
-
-
F. Laermer, A. Schilp, K. Funk, M. Offenberg, Bosch Deep Silicon Etching: Improving Uniformity and Etch Rate for Advanced Mems Applications, Technical Digest MEMS'99, Florida, USA, 1999, pp. 211-216.
-
F. Laermer, A. Schilp, K. Funk, M. Offenberg, Bosch Deep Silicon Etching: Improving Uniformity and Etch Rate for Advanced Mems Applications, Technical Digest MEMS'99, Florida, USA, 1999, pp. 211-216.
-
-
-
-
22
-
-
0036572386
-
-
Quevy E., Parvais B., Raskin J.P., Buchaillot L., Flander D., and Collard D. J. Micromech. Microeng. 12 (2002) 328-333
-
(2002)
J. Micromech. Microeng.
, vol.12
, pp. 328-333
-
-
Quevy, E.1
Parvais, B.2
Raskin, J.P.3
Buchaillot, L.4
Flander, D.5
Collard, D.6
-
24
-
-
0036565107
-
-
Gaboriau F., Peignon M.C., Cartry G., Rolland L., Eon D., Cardinaud C., and Turban G. J. Vac. Sci. Technol. A 20 (2002) 919-927
-
(2002)
J. Vac. Sci. Technol. A
, vol.20
, pp. 919-927
-
-
Gaboriau, F.1
Peignon, M.C.2
Cartry, G.3
Rolland, L.4
Eon, D.5
Cardinaud, C.6
Turban, G.7
-
26
-
-
0037817771
-
-
S. Frederico, C. Hibert, Silicon Sacrificial Layer Dry Etching (SSLDE) for Free-standing RF MEMS Architectures, Proceedings of the IEEE Micro Electro Mechanical Systems (MEMS), 2003, pp. 570-573.
-
S. Frederico, C. Hibert, Silicon Sacrificial Layer Dry Etching (SSLDE) for Free-standing RF MEMS Architectures, Proceedings of the IEEE Micro Electro Mechanical Systems (MEMS), 2003, pp. 570-573.
-
-
-
|