Micrometer-scale magnetometry of thin Ni80Fe20 films using ultrasensitive microcantilevers

Journal of Applied Physics

Volumn 93, Issue 10 3, 2003, Pages 7897-7899

  Chabot, Michelle D ^a   Moreland, John ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FERROMAGNETIC MATERIALS; MAGNETIC FIELD EFFECTS; MAGNETIC HYSTERESIS; MAGNETIC MOMENTS; NATURAL FREQUENCIES; NICKEL COMPOUNDS; TORQUE;

MICROCANTILEVERS;

MAGNETIC THIN FILMS;

EID: 0038317752     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1557759     Document Type: Conference Paper

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