-
2
-
-
0030014940
-
A sensitive method to measure changes in the surface stress of solids
-
(b) Butt H.-J. A sensitive method to measure changes in the surface stress of solids. J. Colloid Interface Sci. 180:1996;251-260.
-
(1996)
J. Colloid Interface Sci.
, vol.180
, pp. 251-260
-
-
Butt, H.-J.1
-
3
-
-
0032769127
-
An artificial nose based on a micromechanical cantilever array
-
(a) Lang H.P., Baller M.K., Berger R., Gerber Ch., Gimzewski J.K., Battiston F.M., Fornaro P., Ramseyer J.P., Meyer E., Guntherodt H.J. An artificial nose based on a micromechanical cantilever array. Anal. Chim. Acta. 393:1999;59-65
-
(1999)
Anal. Chim. Acta
, vol.393
, pp. 59-65
-
-
Lang, H.P.1
Baller, M.K.2
Berger, R.3
Gerber, Ch.4
Gimzewski, J.K.5
Battiston, F.M.6
Fornaro, P.7
Ramseyer, J.P.8
Meyer, E.9
Guntherodt, H.J.10
-
6
-
-
0034646725
-
Translating biomolecular recognition into nanomechanics
-
(a) Fritz J., Baller M.K., Lang H.P., Rothuizen H., Vettiger P., Meyer E., Güntherodt H.-J., Gerber Ch., Gimzewski J.K. Translating biomolecular recognition into nanomechanics. Science. 288:2000;316-318
-
(2000)
Science
, vol.288
, pp. 316-318
-
-
Fritz, J.1
Baller, M.K.2
Lang, H.P.3
Rothuizen, H.4
Vettiger, P.5
Meyer, E.6
Güntherodt, H.-J.7
Gerber, Ch.8
Gimzewski, J.K.9
-
7
-
-
0035298847
-
Cantilever-based optical deflection assay for discrimination of DNA single nucleotide mismatches
-
(b) Hansen K.M., Ji H.-F., Wu G., Datar R., Cote R., Majumdar A., Thundat T. Cantilever-based optical deflection assay for discrimination of DNA single nucleotide mismatches. Anal. Chem. 73(7):2001;1567-1571
-
(2001)
Anal. Chem.
, vol.73
, Issue.7
, pp. 1567-1571
-
-
Hansen, K.M.1
Ji, H.-F.2
Wu, G.3
Datar, R.4
Cote, R.5
Majumdar, A.6
Thundat, T.7
-
8
-
-
0035852777
-
Nanomechanical signatures of biomolecular recognition and interactions
-
(c) Wu G., Ji H.-F., Hansen K., Thundat T., Datar R., Cote R., Hagan M.F., Chakraborty A.K., Majumdar A. Nanomechanical signatures of biomolecular recognition and interactions. Proc. Natl. Acad. Sci. U.S.A. 98:2001;1560-1564.
-
(2001)
Proc. Natl. Acad. Sci. U.S.A.
, vol.98
, pp. 1560-1564
-
-
Wu, G.1
Ji, H.-F.2
Hansen, K.3
Thundat, T.4
Datar, R.5
Cote, R.6
Hagan, M.F.7
Chakraborty, A.K.8
Majumdar, A.9
-
9
-
-
0030769421
-
Surface stress in the self-assembly of alkanethiols on gold
-
Berger R., Delamarche E., Lang H.P., Gerber C., Gimzewski J.K., Meyer E., Güntherodt H.-J. Surface stress in the self-assembly of alkanethiols on gold. Science. 276:1997;2021.
-
(1997)
Science
, vol.276
, pp. 2021
-
-
Berger, R.1
Delamarche, E.2
Lang, H.P.3
Gerber, C.4
Gimzewski, J.K.5
Meyer, E.6
Güntherodt, H.-J.7
-
10
-
-
0034696599
-
A novel self-assembled monolayer coated microcantilever for low level cesium detection
-
(a) H.F. Ji, R. Dabestani, E. Finot, T. Thundat, G.M. Brown, P.F. Britt, A novel self-assembled monolayer coated microcantilever for low level cesium detection, Chem. Commun. (2000), 457-458
-
(2000)
Chem. Commun.
, pp. 457-458
-
-
Ji, H.F.1
Dabestani, R.2
Finot, E.3
Thundat, T.4
Brown, G.M.5
Britt, P.F.6
-
14
-
-
36849104521
-
Calculated elastic constants for stress problems associated with semiconductor devices
-
Brantley W.A. Calculated elastic constants for stress problems associated with semiconductor devices. J. Appl. Phys. 44:1973;534. http://www.korth.de/material/sio2.htm.
-
(1973)
J. Appl. Phys.
, vol.44
, pp. 534
-
-
Brantley, W.A.1
-
15
-
-
0024701981
-
Structure and reactivity of alkylsiloxane monolayers formed by reaction of alkyltrichlorosilanes on silicon substrates
-
Wasserman S.R., Tao Y.-T., Whitesides G.M. Structure and reactivity of alkylsiloxane monolayers formed by reaction of alkyltrichlorosilanes on silicon substrates. Langmuir. 5:1989;1074.
-
(1989)
Langmuir
, vol.5
, pp. 1074
-
-
Wasserman, S.R.1
Tao, Y.-T.2
Whitesides, G.M.3
-
16
-
-
0347109208
-
-
Veeco Instruments, See probes under http://store.veeco.com.
-
-
-
-
17
-
-
0030401241
-
High etch rate, anisotropic deep silicon plasma etching for the fabrication of microsensors
-
Pandhumsopom T., Feldbaum M., Gadgil P. High etch rate, anisotropic deep silicon plasma etching for the fabrication of microsensors. SPIE. 2879:1994;94.
-
(1994)
SPIE
, vol.2879
, pp. 94
-
-
Pandhumsopom, T.1
Feldbaum, M.2
Gadgil, P.3
-
18
-
-
0027540056
-
A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy
-
Cleveland J.P., Manne S., Bocek D., Hansma P.K. A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy. Rev. Sci. Instrum. 64:1993;403-405.
-
(1993)
Rev. Sci. Instrum.
, vol.64
, pp. 403-405
-
-
Cleveland, J.P.1
Manne, S.2
Bocek, D.3
Hansma, P.K.4
-
19
-
-
0001255981
-
Fabrication and characterization of 100-nm-thick GaAs Cantilever
-
Harris J.G.E., Awschalom D.D. Fabrication and characterization of 100-nm-thick GaAs Cantilever. Rev. Sci. Instrum. 67(10):1996;3591-3593.
-
(1996)
Rev. Sci. Instrum.
, vol.67
, Issue.10
, pp. 3591-3593
-
-
Harris, J.G.E.1
Awschalom, D.D.2
-
20
-
-
0036144366
-
Fabrication of single-crystal Si cantilever array
-
Saya D., Fukushima K., Toshiyyosh H., Hashiguch G., Fujita H., Kawakatsu H. Fabrication of single-crystal Si cantilever array. Sens. Actuators A. 95:2002;281-287.
-
(2002)
Sens. Actuators A
, vol.95
, pp. 281-287
-
-
Saya, D.1
Fukushima, K.2
Toshiyyosh, H.3
Hashiguch, G.4
Fujita, H.5
Kawakatsu, H.6
-
21
-
-
58749086215
-
Characterization of application specific probes for SPMs
-
Micromachining and Imaging, T.A. Michalske (Ed.), ISBN: 0-8194-2420-x
-
Tortones M., Kirk M. Characterization of application specific probes for SPMs. SPIE Proc. 3009:1997;53-60 Micromachining and Imaging, T.A. Michalske (Ed.), ISBN: 0-8194-2420-x.
-
(1997)
SPIE Proc.
, vol.3009
, pp. 53-60
-
-
Tortones, M.1
Kirk, M.2
-
22
-
-
0027403888
-
Scan speed limit in atomic force microscopy
-
Butt H.-J., Siedle P., Seifert K., Seeger T., Fendler K., Bamberg E., Goldie K., Engel A. Scan speed limit in atomic force microscopy. J. Microsc. 169:1993;75-84.
-
(1993)
J. Microsc.
, vol.169
, pp. 75-84
-
-
Butt, H.-J.1
Siedle, P.2
Seifert, K.3
Seeger, T.4
Fendler, K.5
Bamberg, E.6
Goldie, K.7
Engel, A.8
-
25
-
-
0030233248
-
Influent of substrates on the elastic reaction of films for the microindentation tests
-
Kim M.T. Influent of substrates on the elastic reaction of films for the microindentation tests. Thin Solid Films. 283:1996;12-16.
-
(1996)
Thin Solid Films
, vol.283
, pp. 12-16
-
-
Kim, M.T.1
-
26
-
-
0030213903
-
Effect of out-of-plane properties of a polyimide film on the stress fields in microelectronic structures
-
Dolbow J., Gosz M. Effect of out-of-plane properties of a polyimide film on the stress fields in microelectronic structures. Mech. Mater. 23:1996;311-321.
-
(1996)
Mech. Mater.
, vol.23
, pp. 311-321
-
-
Dolbow, J.1
Gosz, M.2
-
27
-
-
0030565779
-
Laser diagnostics of mechanical and elastic properties of silicon and carbon films
-
Hess P. Laser diagnostics of mechanical and elastic properties of silicon and carbon films. Appl. Surf. Sci. 106:1996;429-437.
-
(1996)
Appl. Surf. Sci.
, vol.106
, pp. 429-437
-
-
Hess, P.1
-
28
-
-
0012692851
-
Modelling and finite element analysis of ultra-microhardness indentation of thin films
-
Gan L., Ben-Nissan B., Ben-David A. Modelling and finite element analysis of ultra-microhardness indentation of thin films. Thin Solid Films. 290-291:1996;362-366.
-
(1996)
Thin Solid Films
, vol.290-291
, pp. 362-366
-
-
Gan, L.1
Ben-Nissan, B.2
Ben-David, A.3
|