Microstructure and dislocation of epitaxial InN films revealed by high resolution x-ray diffraction

Journal of Applied Physics

Volumn 103, Issue 2, 2008, Pages

  Liu, B ^a   Zhang, R ^a   Xie, Z L ^a   Lu, H ^a   Liu, Q J ^a   Zhang, Z ^a   Li, Y ^a   Xiu, X Q ^a   Chen, P ^a   Han, P ^a   Gu, S L ^a   Shi, Y ^a   Zheng, Y D ^a   Schaff, W J ^b  

^a NANJING UNIVERSITY   (China)

^b Cornell University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INDIUM COMPOUNDS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MICROSTRUCTURE; MOLECULAR BEAM EPITAXY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

INN FILMS; MOSAIC TILT;

METALLIC FILMS;

EID: 38849159968     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2832753     Document Type: Article

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