Determination of the azimuthal orientational spread of GaN films by x-ray diffraction

Applied Physics Letters

Volumn 81, Issue 26, 2002, Pages 4928-4930

  Sun, Yue Jun ^a   Brandt, Oliver ^a   Liu, Tian Yu ^a   Trampert, Achim ^a   Ploog, Klaus H ^a   Bläsing, Jürgen ^b   Krost, Alois ^b  

^a PDI fur Festkörperelektronik ^*  (Germany)

^b OTTO VON GUERICKE UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATIONS (CRYSTALS); GALLIUM NITRIDE; MOLECULAR ORIENTATION; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

AZIMUTHAL ORIENTATIONAL SPREAD;

THIN FILMS;

EID: 0037164892     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1531832     Document Type: Article

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