Electrical characterization, modelling and simulation of MOS structures with high-k gate stacks

High-K Gate Dielectrics

Volumn , Issue , 2003, Pages 251-290

  Autran, Jean Luc ^a   Munteanu, Daniela ^a   Houssa, Michel ^a  

^a AIX MARSEILLE UNIVERSITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 38849115315     PISSN: None     EISSN: None     Source Type: Book    
DOI: None     Document Type: Chapter

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