Electrostatic force microscopy studies of boron-doped diamond films

Journal of Materials Research

Volumn 22, Issue 11, 2007, Pages 3014-3028

  Gupta, S ^a   Williams, O A ^b   Bohannan, E ^c  

^a UNIVERSITY OF MISSOURI   (United States)

^b HASSELT UNIVERSITY   (Belgium)

^c MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIAMOND FILMS; ELECTRIC CONDUCTIVITY; ELECTROCHEMICAL PROPERTIES; ELECTROSTATIC FORCE; MORPHOLOGY; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

BORON DOPING; BORON-DOPED DIAMOND FILMS; ELECTROSTATIC FORCE MICROSCOPY;

BORON;

EID: 36549048448     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2007.0229     Document Type: Article

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