Scanning electrochemical microscopy and conductive probe atomic force microscopy studies of hydrogen-terminated boron-doped diamond electrodes with different doping levels

Journal of Physical Chemistry B

Volumn 108, Issue 39, 2004, Pages 15117-15127

  Holt, Katherine B ^a   Bard, Allen J ^a   Show, Yoshiyuki ^b   Swain, Greg M ^b  

^a University of Texas at Austin   (United States)

^b MICHIGAN STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CYCLIC VOLTAMMOGRAMS; DOPING LEVELS; ELECTRODE SURFACES; SCANNING ELECTROCHEMICAL MICROSCOPY (SECM);

ATOMIC FORCE MICROSCOPY; BORON; DIAMONDS; DOPING (ADDITIVES); ELECTROCHEMISTRY; HYDROGEN; MICROELECTRODES;

ELECTRODES;

EID: 6344222118     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp048222x     Document Type: Article

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