Control of grain size and size effect on the dielectric constant of diamond films

Journal of Physics D: Applied Physics

Volumn 33, Issue 23, 2000, Pages

  Ye, Haitao ^a   Sun, Chang Q ^b   Hing, Peter ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; FLOW MEASURING INSTRUMENTS; GRAIN SIZE AND SHAPE; MORPHOLOGY; NANOSTRUCTURED MATERIALS;

RESISTANCE CAPACITANCE INDUCTANCE (RCL) METERS;

DIAMOND FILMS;

EID: 0034499616     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/33/23/103     Document Type: Article

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