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Volumn 310, Issue 1, 2008, Pages 62-70

Growth kinetics and boron doping of very high Ge content SiGe for source/drain engineering

Author keywords

A1. Growth models; A3. Chemical vapor deposition processes; B1. Germanium silicon compounds

Indexed keywords

BORON; CHEMICAL VAPOR DEPOSITION; DOPING (ADDITIVES); GERMANIUM; MATHEMATICAL MODELS; SEMICONDUCTOR GROWTH;

EID: 36549022508     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2007.10.003     Document Type: Article
Times cited : (34)

References (31)
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    • A.V.-Y. Thean, D. Zhang, V. Vartanian, V. Adams, J. Conner, M. Canonico, H. Desjardin, P. Grudowski, B. Gu, Z.-H. Shi, S. Murphy, G. Spencer, S. Filipiak, D. Goedeke, X.-D. Wang, B. Goolsby, V. Dhanpani, L. Prabhu, S. Backer, L.-B. La, D. Burnett, T. White, B.-Y. Nguyen, B.E. White, S. Venkatesan, J. Mogab, I. Cayrefourc, C. Mazure, in: Proceedings of the Symposium on VLSI Technology, Honolulu, USA, 2006, p. 164.
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    • H. Yin, Z. Ren, H. Chen, J. Holt, X. Liu, J.W. Sleight, K. Rim, V. Chan, D.M. Fried, Y.H. Kim, J.O. Chu, B.J. Greene, S.W. Bedell, G. Pfeiffern, R. Bendernagel, D.K. Sadana, T. Kanarski, C.Y. Sung, M. Ieong, G. Shahidi, Symposium on VLSI Technology, Honolulu, USA, 2006, p. 94.
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    • Y.S. Kim, Y. Shimamune, M. Fukuda, A. Katakami, A. Hatada, K. Kawamura, H. Ohta, T. Sakuma, Y. Hayami, H. Morioka, J. Ogura, T. Minami, N. Tamura, T. Mori, M. Kojima, K. Sukegawa, K.Hashimoto, M. Miyajima, S. Satoh, T. Sugii, in: Proceedings of the 2006 IEDM Conference, San-Francisco, USA, p. 871.
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    • 3 ([Ge]=50%). Knowing the natural abundance of the 11B isotope (80.1%), it is then straightforward to find the boron atoms concentration by multiplying the 11B concentration by 100/80.1.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.