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Volumn 8, Issue 4, 2007, Pages 277-280

Characterization of hexagonal defects in gallium nitride on sapphire

Author keywords

Defects; Gallium nitride; SEM

Indexed keywords


EID: 35248848906     PISSN: 12299162     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (5)

References (21)
  • 9
    • 0036565364 scopus 로고    scopus 로고
    • S.J. Pearton, M.E. Overberg, G. Thaler, C.R. Abernathy, N. Theodoropoulou, A.F. Hebard, S.N.G. Chu, R.G. Wilson, J. M. Zavada, A.Y. Polykov, A.V. Osinsky, P.E. Norris, P.P. Chow, A.M. Wowchack, J.M. Van Hove, and Y.D. Park, J. Vacuum Science & Technology A 20 (2002) 721-724.
    • S.J. Pearton, M.E. Overberg, G. Thaler, C.R. Abernathy, N. Theodoropoulou, A.F. Hebard, S.N.G. Chu, R.G. Wilson, J. M. Zavada, A.Y. Polykov, A.V. Osinsky, P.E. Norris, P.P. Chow, A.M. Wowchack, J.M. Van Hove, and Y.D. Park, J. Vacuum Science & Technology A 20 (2002) 721-724.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.