Growth and thermal stability of Ga(1-X) CrXN films

Applied Physics Letters

Volumn 86, Issue 13, 2005, Pages 1-3

  Thaler, G T ^a   Frazier, R M ^a   Abernathy, C R ^a   Pearton, S J ^a  

^a University of Florida   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; DIFFRACTOMETERS; GALLIUM COMPOUNDS; MAGNETIZATION; MAGNETOMETERS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MOLECULAR BEAM EPITAXY; RAPID THERMAL ANNEALING; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SECONDARY ION MASS SPECTROMETRY; SQUIDS; THERMODYNAMIC STABILITY; THIN FILMS; X RAY POWDER DIFFRACTION;

FERROMAGNETIC ORDERING; MAGNETIC CHARACTERIZATION; SPINTRONICS; X-RAY DIFFRACTOMETERS;

FILM GROWTH;

EID: 17744362925     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1895479     Document Type: Article

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