Influence of substrate-induced biaxial compressive stress on the optical properties of thin GaN films

Applied Physics Letters

Volumn 68, Issue 7, 1996, Pages 970-972

  Rieger, W ^a   Metzger, T ^a   Angerer, H ^a   Dimitrov, R ^a   Ambacher, O ^a   Stutzmann, M ^a  

^a WALTER SCHOTTKY INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EMISSION SPECTROSCOPY; ENERGY GAP; METALLORGANIC CHEMICAL VAPOR DEPOSITION; NITRIDES; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; RAMAN SPECTROSCOPY; SAPPHIRE; SEMICONDUCTING GALLIUM COMPOUNDS; STRESSES; THERMAL EXPANSION; X RAY DIFFRACTION;

ALUMINUM NITRIDE; BIAXIAL COMPRESSIVE STRESS; FILM THICKNESS EFFECTS; FREQUENCY SHIFT; GALLIUM NITRIDE; LATTICE MISMATCH;

THIN FILMS;

EID: 0030087417     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116115     Document Type: Article

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