Optimization of NoC wrapper design under bandwidth and test time constraints

Proceedings - 12th IEEE European Test Symposium, ETS 2007

Volumn , Issue , 2007, Pages 35-40

  Hussin, Fawnizu Azmadi ^a   Yoneda, Tomokazu ^a   Fujiwara, Hideo ^a  

^a NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; CIRCUIT THEORY; CONSTRAINT THEORY; OPTIMIZATION;

BANDWIDTH EFFICIENCY; HIGH-COST WRAPPERS;

CHIP SCALE PACKAGES;

EID: 34548809233     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETS.2007.30     Document Type: Conference Paper

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