Three-dimensional design and replication of silicon oxide nanostructures using an atomic force microscope

Nanotechnology

Volumn 18, Issue 34, 2007, Pages

  Johannes, Matthew S ^a,b   Cole, Daniel G ^b,c   Clark, Robert L ^a,b  

^a Duke University   (United States)

^b Center for Biologically Inspired Materials and Material Systems (CBIMMS)   (United States)

^c University of Pittsburgh   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER AIDED DESIGN; NANOSTRUCTURED MATERIALS; VOLTAGE CONTROL;

PROBE SPEED; THREE DIMENSIONAL MODELING; VOLTAGE BIAS;

SILICA;

NANOMATERIAL; SILICON;

ARTICLE; ATOMIC FORCE MICROSCOPY; COMPUTER AIDED DESIGN; ELECTRIC POTENTIAL; HUMIDITY; NANOANALYSIS; PRIORITY JOURNAL;

EID: 34547812083     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/18/34/345304     Document Type: Article

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