Nanodispenser for attoliter volume deposition using atomic force microscopy probes modified by focused-ion-beam milling

Applied Physics Letters

Volumn 85, Issue 25, 2004, Pages 6260-6262

  Meister, A ^a   Liley, M ^a   Brugger, J ^b   Pugin, R ^a   Heinzelmann, H ^a  

^a CSEM   (Switzerland)

^b EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ATMOSPHERIC HUMIDITY; ATOMIC FORCE MICROSCOPY; GLYCEROL; HYDROPHOBICITY; INTERFACES (MATERIALS); INTERFACIAL ENERGY; ION BEAMS; LAPLACE TRANSFORMS; MILLING (MACHINING); NANOSTRUCTURED MATERIALS; SURFACE ROUGHNESS; SURFACE TENSION;

ATOMIC FORCE MICROSCOPES; ION BEAM MILLING; LIQUID DROPLETS; NANODISPENSER;

DISPENSERS;

EID: 20444461212     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1842352     Document Type: Article

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