Size determination of field-induced water menisci in noncontact atomic force microscopy

Journal of Applied Physics

Volumn 92, Issue 9, 2002, Pages 5539-5542

  Calleja, Montserrat ^a   Tello, Marta ^a   García, Ricardo ^a  

^a INSTITUTO DE MICROELECTRÓNICA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPE (AFM); ELECTRICAL FIELD; EXPERIMENTAL MEASUREMENTS; FIELD-INDUCED; LOCAL OXIDATION; NONCONTACT ATOMIC FORCE MICROSCOPY; PULSE DURATIONS; SILICON SURFACES; VERTICAL DIMENSIONS; VOLTAGE PULSE; WATER CAPILLARIES;

ELECTRIC POTENTIAL;

ATOMIC FORCE MICROSCOPY;

EID: 0942267834     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1510171     Document Type: Article

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